Tin sulfide (SnS) films were prepared by thermal evaporation method using Glancing Angle Deposition (GLAD) technique at zero and different oblique incident flux angles (alpha=45 degrees, 55 degrees, 65 degrees, 75 degrees and 85 degrees). The physical properties of prepared films were systematically investigated. The X-ray diffraction analysis indicated that the film deposited at alpha = 0 degrees formed as single phase with an orthorhombic structure. However, the layers became amorphous at alpha = 45 degrees, 55 degrees, 65 degrees, 75 degrees and 85 degrees. Beside the appearance of amorphous feature in the film prepared at a higher than zero, Sn2S3 phase was also observed. The top and crosssectional field emission scanning electron microscope (FESEM) images of the samples showed noticeable changes in the structure and morphology of individual nano-plates as a function of incident angle. The band gap and refractive index values of the films were calculated by optical transmission measurements. The optical band-gap values were observed to increase with increasing the incident flux angle. This can be due to presence of Sn2S3 phase observed in the samples produced at alpha values other than zero. The effective refractive index and porosity exhibit an opposite evolution as the incident angle alpha rises. At alpha = 85 degrees the layers show a considerable change in effective refractive index (Delta n = 1.7) at near-IR spectral range. (C) 2017 Elsevier B.V. All rights reserved.