Journal of Crystal Growth, Vol.450, 28-33, 2016
Multifractal spectrums for volumes of spatial forms on surface of ZnxCd1-xTe-Si (111) heterostructures and estimation of the fractal surface energy
Multifractal (MF) analysis is used to describe volumes of spatial forms that are formed on the surface of thin layers of ZnxCd1-xTe solid solution grown on the Si (111) substrate. MF analysis is performed on the basis of AFM images of the solid solution surface. The parameters of the MF spectrums for the distribution of volumes of the spatial forms, which formed the surface relief, were found. On the basis of a formal approach and data on the multifractal parameters for the volume and the area of the surface spatial forms the mathematic expression which takes into account the contribution of the fractal surface structure in its surface energy were proposed. The behavior of the surface energy of the system depending on the fractal parameters that describe the volume and the area of the spatial forms on the fractal surface were discussed. (C) 2016 Published by Elsevier B.V.
Keywords:Multifractal analysis;Self-similarity and self-organization;Surface structure;Nanomaterials;II-VI Semiconductor materials