Flow-induced shish formation in semicrystalline polymers is an important phenomenon since shish can strongly influence final material properties. The formation, dissolution, and re-emergence of flow-induced shish were studied for a polyethylene system with a broad molecular weight distribution using time-resolved synchrotron small-angle X-ray scattering (SAXS). The results show that shish are generated for a critical strain of 100 at various shear rates, ranging from 25 to 200 s(-1). The shish formed at 140 degrees C are not stable and decay during a subsequent isothermal process. The specific shish dissolution dynamics is in contrast with the shish formation, affected by the shear rate applied. Unexpectedly, when the polymer melt with dissolved shish was cooled down, shish re-emerges. It demonstrates that the shish created did not dissolve completely into relaxed random coils but relaxed only partially into some ordered precursors that are below the limit of SAXS detection. Moreover, shish dissolution dynamics was significantly slowed down by lowering the isothermal annealing temperature from 140 to 138 or 135 degrees C, indicating that the shish dissolution involves more than chain mobility at low temperatures.