Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.16, No.17, 1457-1459, 1997 DOI10.1023/A:1018542217877 Export Citation A Structural Characterization of AlN Thin-Film Deposited on a Single-Crystal Al2O3(0001) Substrate Kim KH, Chang CH, Koo YM Keywords:X-RAY-DIFFRACTION;SAPPHIRE Please enable JavaScript to view the comments powered by Disqus.
