Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.15, No.24, 2137-2140, 1996 Export Citation Quantitative Characterization of Fracture Surface-Roughness Using Secondary-Electron Line Scanning Method Li XW, Tian JF, Kang Y, Su HH, Wang ZG Keywords:GENERAL-METHOD;FRACTOGRAPHY Please enable JavaScript to view the comments powered by Disqus.
