Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.15, No.23, 2080-2084, 1996 Export Citation Controlled Modification of Conducting Polymer Surfaces by Atomic-Force Microscope Zhou L, Zhang PC, Ho PK, Xu GQ, Li SF, Chan L Keywords:SCANNING PROBE MICROSCOPE;NANOMETER-SCALE;METAL-SURFACES;NANOINDENTATION;REMOVAL;TOOL Please enable JavaScript to view the comments powered by Disqus.
