Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.14, No.5, 361-365, 1995 DOI10.1007/BF00592150 Export Citation The AES and Micro-Raman Characteristics of Diamond Thin-Films Grown by Eacvd as the Nucleation Free-Energy Increases Lee CR, Leem JY, Chun BS Keywords:AUGER-ELECTRON SPECTROSCOPY;DEPOSITION;PLASMA;CARBON;GAS Please enable JavaScript to view the comments powered by Disqus.
