화학공학소재연구정보센터
Journal of Materials Science, Vol.35, No.4, 1017-1021, 2000
Dielectric relaxation in glassy Se80-xTe20Gex
Dielectric relaxation studies have been made in glassy Se80-xTe20Gex alloys where 0 less than or equal to x less than or equal to 20. The measurements of dielectric constant (epsilon') and dielectric loss (epsilon ") are made in the audio frequency range (1 kHz to 10 kHz) at various temperatures from 30 degrees C to 150 degrees C. The results indicate that the dielectric dispersion occurs in the above frequency and temperature range. An analysis of the results shows that the dielectric losses are dipolar in nature and can be understood in terms of hopping of charge carriers over a potential barrier.