Over the last years, the phase-field method has been established to model capillarity-induced microstructural evolution in various material systems. Several phase-field models were introduced and different studies proved that the microstructure evolution is crucially affected by the triple junction (TJ's) mobilities as well as the evolution of the dihedral angles. In order to understand basic mechanisms in multi-phase systems, we are interested in the time evolution of TJ's, especially in the contact angles in these regions. Since the considered multi-phase systems consist of a high number of grains, it is not feasible to measure the angles at all TJ's by hand. In this work, we present a method enabling the localization of TJ's and the measurement of dihedral contact angles in the diffuse interface inherent in the phase-field model. Based on this contact angle measurement method, we show how to calibrate the phase-field model in order to satisfy Young's law for different contact angles.