Copper indium gallium diselenide (CIGS) thin films have shown considerable promise for use as an absorber layer in high-efficiency solar cells. The initial results obtained from the preparation of CIGS firms via laser ablation and flash evaporation are presented along with a comparison of the two deposition processes. The as-deposited CIGS films have been characterized by a variety of techniques, namely Rutherford back scattering and energy dispersive analysis using X-rays for composition measurements X-ray diffraction and Raman spectroscopy for structure elucidation, SEM for surface examination, and the four-point probe for resistivity measurements. In essence, good-quality coatings of CIGS were produced from both deposition processes in terms of their stoichiometry, electrical and structural properties.