Grain boundaries in additive-free ZnO show different types of conductive mode contrast, depending on the electrical properties. Electron beam scattering patterns have been used to determine the misorientation of grain boundaries showing certain types of conductive mode contrast in order to correlate electrical properties with grain-boundary structure. No correlations were apparent using the coincident-site lattice model, but other criteria suggest that grain-boundary electrical properties may be crystallographically controlled. More detailed analysis will require the full determination of the grain-boundary plane.