화학공학소재연구정보센터
Journal of Materials Science, Vol.32, No.13, 3349-3353, 1997
Conduction Mechanisms in Coevaporated Mixed Mn/SiOx Thin-Films
The thermoelectric power and d.c. conductivity of co-evaporated Mn/SiOx films, 100 nm thick, containing 20 to 100 at% Mn have been measured over the temperature ranges 275 to 580 K and 110 and 575 K, respectively. Three conduction regions have been identified : p-type, via non-polaronic holes and small polarons; intrinsic and metallic. The d.c. conductivity arises from a combination of non-activated and activated processes.