Journal of Materials Science, Vol.31, No.17, 4693-4695, 1996
Transmission Electron-Microscopy Observations of Antiphase Boundaries in CdTe
Specimens from CdTe crystals, prepared by two different methods were examined by transmission electron microscopy. Antiphase boundaries were observed in both the {110} and {311} planes. Comparatively regularly ordered partial dislocations with a Burgers vector b = a/6 [112] were found in both cases. The distance between partial dislocations is about 6-8 nm. The probable formation mechanism of these boundaries is discussed.