Journal of Materials Science, Vol.29, No.1, 175-178, 1994
Electrical-Properties of Si4+ Substituted Copper Ferrite
The electrical resistivity, rho, and Seebeck coefficient, alpha, for the system Cu1+xSixFe2-2xO4 (where x = 0.05, 0.1, 0.1 5, 0.2 and 0.3) have been studied as a function of temperature. Temperature variation of the resistivity exhibits two breaks. Each break is associated with a change in activation energy. The conduction process at low temperature is governed by the reaction Cu(A)1+ + Cu(A)2+ --> Cu(A)2+ + Cu(A)1+. However, at higher temperature, it is due to intersite cation exchange and reoxidation such as Cu(A)2+ + Fe(B)3+ --> CU(B)2+ + Fe(A)3+. Measurement of the Seebeck coefficient, alpha, from room temperature to 800 K reveals n-type conduction for the sample with x = 0.05, while the measurements for other samples show p-type conduction for lower temperatures and n-type conduction at higher temperatures. The activation energies in the paramagnetic region are found to be less than those in the ferrimagnetic region.