We have measured the cross-plane thermal conductivity () of (010)-textured, undoped, and lanthanum-doped strontium niobate (Sr2-xLaxNb2O7-) thin films via time-domain thermoreflectance. The thin films were deposited on (001)-oriented SrTiO3 substrates via the highly-scalable technique of chemical solution deposition. We find that both film thickness and lanthanum doping have little effect on , suggesting that there is a more dominant phonon scattering mechanism present in the system; namely the weak interlayer-bonding along the b-axis in the Sr2Nb2O7 parent structure. Furthermore, we compare our experimental results with two variations of the minimum-limit model for and discuss the nature of transport in material systems with weakly-bonded layers. The low cross-plane of these scalably-fabricated films is comparable to that of similarly layered niobate structures grown epitaxially.