Previous Article Next Article Table of Contents Journal of Electroanalytical Chemistry, Vol.385, No.2, 273-277, 1995 DOI10.1016/0022-0728(94)03869-5 Export Citation Nanoscale Thickness Changes of Nickel-Hydroxide Films During Electrochemical Oxidation-Reduction Monitored by in-Situ Atomic-Force Microscopy Haring P, Kotz R Keywords:QUARTZ CRYSTAL MICROBALANCE;NIOX THIN-FILMS;ELECTRODES;BEHAVIOR Please enable JavaScript to view the comments powered by Disqus.
