화학공학소재연구정보센터
Journal of Electroanalytical Chemistry, Vol.381, No.1-2, 113-121, 1995
In-Situ Examination of Anodic Silver-Oxide Films by EXAFS in the Reflection Mode
Thin sputter-deposited silver films were oxidized anodically in 1 M NaOH. The structural modifications of the silver electrode surface during the course of a complete oxidation/reduction cycle were studied in situ with the grazing incidence X-ray absorption fine structure technique. The results show that the short-range order structure of the anodic oxide films is similar to that of crystalline Ag2O powder at 0.6 V while it resembles the structure of crystalline AgO at 0.85 V (SHE). Besides a significantly reduced reflectivity, the metal surface revealed a more disordered near-order structure after a completed oxidation/reduction cycle.