Previous Article Next Article Table of Contents Advanced Materials, Vol.26, No.48, 8225-8230, 2014 DOI10.1002/adma.201403647 Export Citation Origin of Leakage Paths Driven by Electric Fields in Al-Doped TiO2 Films Park GS, Park SY, Heo S, Kwon O, Cho K, Han KY, Kang SJ, Yoon A, Kim M Please enable JavaScript to view the comments powered by Disqus.
