화학공학소재연구정보센터
Korean Journal of Materials Research, Vol.12, No.8, 661-668, August, 2002
In-line 마그네트론 스퍼터 장치를 사용하여 산소 분위기에서 제작한 Ag 박막의 특성
Properties of Ag Thin Films Deposited in Oxygen Atmosphere Using in- line Magnetron Sputter System
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A study was made to examine the electrical, compositional, structural and morphological properties of Ag thin films deposited by DC magnetron sputtering in O 2 atmosphere with deposition temperature from room temperature to 15 0 ? C using in-line sputter system. The Ag films deposited at temperature above 100 ? C in oxygen atmosphere gave a similar specific resistivity to and even lower oxygen content than those deposited using pure Ar sputter gas The Ag films deposited with pure Ar gas was mainly composed of crystallites with [111] preferred orientation, while, for those deposited in oxygen atmosphere, more than 50% of the volume was composed of crystallites with [100] orientation. The difference in the micro structure did not cause any difference in the specific resistivity of Ag films. The results showed that the transparent conducting oxide films and the Ag films could be processed sequentially in the same deposition chamber with careful control of deposition temperature, which might result in a cost reduction for constructing the large scale in-line deposition system.
  1. Minami T, MRS Bulletin, 38 (2000)
  2. Minami T, Sato H, Nanto H, Takata S, Jpn. J. Appl. Phys. Part 2: Lett., 25, L776 (1986)
  3. Hu J, Gordon RG, Sol. Cells, 30, 437 (1991)
  4. Bender M, Seelig W, Daube C, Frankenberger H, Ocker B, Stollenwerk J, Thin Solid Films, 326(1-2), 67 (1998)
  5. Kloppel A, Meyer B, Trube J, Thin Solid Films, 392(2), 311 (2001)
  6. Charton C, Fahland M, Surf. Coat. Technol., 142, 175 (2001)
  7. Scalora M, Bloomer J, Pethel AS, Dowling JP, Brown CM, Manka AS, J. Appl. Phys., 83(5), 2377 (1998)
  8. Bloomer MJ, Scalora M, Appl. Phys. Lett., 72(14), 1676 (1998)
  9. Ando E, Miyazaki M, Thin Solid Films, 351(1-2), 308 (1999)
  10. Ando E, Suzuki S, Aomine N, Miyazaki M, Tada M, Vacuum, 59, 792 (2000)
  11. Ando E, Miyazaki M, Thin Solid Films, 392(2), 289 (2001)
  12. Xiong YQ, Wu H, Guo Y, Sun Y, Yang DQ, Da D, Thin Solid Films, 375(1-2), 300 (2000)
  13. CRC handbook of Chemistry and Physics, 61st Ed., CRC Press Inc., Boca Raton,Fl., USA, 1980, p.B-145 (1980)
  14. Men L, Tominaga J, Fuji H, Atoda N, Jpn. J. Appl. Phys., 39
  15. Schwartz LH, Cohen JB, Diffraction from Materials, 2nd Ed., p224, Springer-Verlag, Berlin, (1987) (1987)
  16. Ozcomert JS, Pai WW, Bartelt NC, Reutt Robery JE, Phys. Rev. Lett, 72, 258 (1994)
  17. Layson AR, Thiel PA, Surf. Sci., 472, L151 (2001)
  18. Duys GT, Farrel T, Electrical Resistivity Handbook, p.535, Perter Peregrinus Ltd., London, UK, (1992) (1992)