Thin Solid Films, Vol.544, 103-106, 2013
Reliability improvement of a-Si: H thin film transistors on plastic substrate with saturation in deep state after multiple bending cycles
For flexible electronic applications, the disordered bonds of a-Si: H may generate a redistribution of trapped states with mechanical strain. During mechanical strain, the deep states are redistributed in a Gaussian distribution and are dissimilar to ordinary acceptor-like deep states, which manifest with exponential distributions. The redistributed deep states may saturate with multiple mechanical bending cycles, and it would improve the reliability with drain current stress of a-Si: H TFTs (thin film transistors) on flexible substrates. We conclude that it is possible to produce low-cost and highly uniform active-matrix organic light emitting diodes systems for use in flexible display applications using a-Si: H TFTs array backplanes. (C) 2013 Elsevier B.V. All rights reserved.