화학공학소재연구정보센터
Polymer, Vol.55, No.1, 219-225, 2014
Creep compliance mapping by atomic force microscopy
We present a method for mapping the spatial distribution of viscoelastic properties of heterogeneous samples using the atomic force microscope (AFM). By applying a force step load protocol to induce time dependent sample indentations we measured the local creep compliance of the sample. The creep compliance was quantified in terms of the standard linear solid model to give maps of the instant glassy modulus, the equilibrium rubbery modulus, and the retardation time. To reduce the influence of plastic deformations, the sample was preformed with an initial preload step. Different polymer samples with a homogeneous or a heterogeneous material composition on a microscopic scale were investigated. (C) 2013 Elsevier Ltd. All rights reserved.