Previous Article Next Article Table of Contents Materials Science Forum, Vol.457-460, 775-778, 2004 Export Citation Dilute aluminum concentration in 4H-SiC : from SIMS to LTPL measurements Juillaguet S, Zielinski M, Balloud C, Sartel C, Consejo C, Boyer B, Souliere V, Camassel J, Monteil Y Keywords:4H-SiC;photoluminescence;secondary ion mass spectroscopy (SIMS);aluminum Please enable JavaScript to view the comments powered by Disqus.
