The aim of the present study is dedicated to evaluate the mechanical behavior of the sample at the metal-ceramic interface. Residual stresses measurements were realized by synchrotron radiation measurements in order to study the stress field distribution in the sample. Interface measurements between two different materials are difficult to analyze due to the parasitic peak shifts which are obtained in such condition. To correct these systematic errors, a numerical simulation of the whole two-axis spectrometer was developed [1, 2]. The results of diffraction experiments in dental glass-ceramic on palladium alloy substrate sample are reported. The ceramic coating and the Pd alloy substrate were investigated by high energy synchrotron radiation (HESR) on ID15A beamline at ESRF (Grenoble). Residual stresses profile was found to be tensile in the metallic substrate and compressive in the glassy ceramic coating, as predicted by mathematical model.