Materials Science Forum, Vol.414-4, 229-234, 2003
Characterization of the microstructure of severely deformed titanium by X-ray diffraction profile analysis
Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and sigma=0.49, respectively. The dislocation slip system population was found to be 75% type, 20% type and 5% type.
Keywords:crystallite size distribution;dislocation structure;titanium;plastic deformation;X-ray peak profile analysis