We have made some microsections from a damaged pipeline. Optical microscopy is unable to make a difference between voids and inclusions and precipitations. Scanning Electron Microscopy has much more resolving ability than an optical microscope. In BSE (Back Scattered Electron) micrograph the voids can be seen better, in SE (Secondary Electron) micrograph the carbide phases on grain boundaries can be seen. So the Scanning Electron Microscope with two operational modes complete the imperfections of the optical microscope.