Crystallographic planes of Sigma3 boundaries were examined by means of transmission electron microscopy (TEM) for two bulk copper samples, one with a weak and another with a strong texture. Different boundary plane populations were observed for the two differently textured samples. The difference is analyzed based on a grouping of the Sigma3 boundaries into the Sigma3 twin boundaries delineating the boundaries between a twin and the matrix and the Sigma3 non-twin boundaries associated with the boundaries between a twin and the neighboring grains with orientations close to the matrix.