Materials Science Forum, Vol.363-3, 147-149, 2001
Positron study of Cu-Se, In-Se and CuInSe2 thin films
Cu-Se, In-Se and CuInSe2 films, grown on molybdenum substrates via d.c.magnetron sputtering were studied by X - ray diffraction and PAS. The XRD data showed that all studied films are crystalline and some are textured. PAS indicated the presence of monovacancies and small vacancy clusters.