Photoionization dynamics of gas-phase C-60 molecules after selective excitation with synchrotron radiation has been studied with time-of-flight mass spectrometry. The energy level scheme deduced from previous photoelectron and Auger electron spectra is used to analyze the photoion data. At the vicinity of pi* pre-edge resonances the fragmentation of multiply-charged ions varies strongly as a function of photon energy. The C-60(+) ion yield decreases slowly after Is threshold indicating that the slow photoelectrons can get recaptured. Somewhat further above the threshold the enhanced relative fragmentation of the parent C-60(+) ions suggests excitation of the giant plasmon resonance due to 20 eV photoelectrons.