It can be challenging to properly identify the phases in electro-polished duplex stainless steel using optical microscopy or other characterization techniques. This letter describes magnetic force microscopy to properly identify the phases in electropolished duplex stainless steel. The results are also confirmed with the current sensing atomic force and scanning Kelvin probe force microscopy. The difference in topography heights between the ferrite and austenite phases is attributed to the different etching rates during electropolishing, although these phases have different mechanical properties. The current in the austenite is much higher compared with the ferrite, thus current sensing atomic force microscopy can also be used to properly identify the phases. (C) 2013 Elsevier B.V. All rights reserved.