Korea-Australia Rheology Journal, Vol.26, No.1, 39-48, February, 2014
Toward residual-layer-free nanoimprint lithography in large-area fabrication
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In the paper, residual-layer-free nanoimprint lithography for large-area fabrication is reviewed. In order to remove the residual layer during the imprint process, polymer resists and mold materials should be designed with the aspects of surface chemistry and mold geometries in mind. Various approaches for residual-layerfree nanoimprint lithography are discussed including incomplete filling by polymer mass, reverse imprint methods, self-removal techniques, and the employment of elastomeric mold deformation. In addition, issues that must be overcome to enable large-area roll-to-roll nanoimprinting without a residual layer are presented.
- Ahn S, Cha J, Myung H, Kim S, Kang S, Appl. Phys. Lett., 89, 213101 (2006)
- Ahn SH, Guo LJ, Adv. Mater., 20(11), 2044 (2008)
- Ahn SH, Guo LJ, ACS Nano., 3, 2304 (2009)
- Almanza-Workman AM, Taussig CP, Jeans AH, Cobene RL, J. Mater. Chem., 21, 14185 (2011)
- Auner C, Palfinger U, Gold H, Kraxner J, Haase A, Haber T, Sezen M, Grogger W, Jakopic G, Krenn JR, Leising G, Stadlober B, Org.Elec., 10, 1466 (2009)
- Auner C, Palfinger U, Gold H, Kraxner J, Haase A, Haber T, Sezen M, Grogger W, Jakopic G, Krenn JR, Leising G, Stadlober B, Organic Electronics., 11, 552 (2010)
- Austin MD, Chou SY, Appl. Phys. Lett., 81, 4431 (2002)
- Bailey T, Choi BJ, Colburn M, Meissl M, Shaya S, Ekerdt JG, Sreenivasan SV, Willson CG, J. Vac. Sci. Technol. B, 18(6), 3572 (2000)
- Bao LR, Cheng X, Huang XD, Guo LJ, Pang SW, Yee AF, J. Vac. Sci. Technol. B, 20(6), 2881 (2002)
- Bessonov A, Seo JW, Kim JG, Hwang ES, Lee JW, Cho JW, Kim DJ, Lee S, Microelectron. Eng., 88, 2913 (2011)
- Bogdanski N, Wissen M, Ziegler A, Sheer HC, Microelectron. Eng., 78-79, 598 (2005)
- Cheng X, Hong YT, Kanicki J, Guo LJ, J. Vac. Sci. Technol. B, 20(6), 2877 (2002)
- Cheng X, Guo LJ, Microelectron. Eng., 71, 277 (2004)
- Cheng X, Li D, Guo LJ, Nanotechnology., 17, 927 (2006)
- Choi SJ, Yoo PJ, Baek SJ, Kim TW, Lee HH, J. Am. Chem. Soc., 126(25), 7744 (2004)
- Choi SJ, Tahk D, Yoon H, J. Colloid Interface Sci., 340(1), 74 (2009)
- Chou SY, Krauss PR, Renstrom PJ, Science, 272(5258), 85 (1996)
- Chou SY, Krauss PR, Zhang W, Guo LJ, Zhuang L, J. Vac. Sci. Technol. B, 15(6), 2897 (1997)
- Chuang CH, Tsai SW, Lin JF, Chen CP, Jpn. J. Appl. Phys., 06GK01., 50 (2011)
- Chung YC, Chiu YH, Liu HJ, Chang YF, Cheng CY, Hong FCN, J. Vac. Sci. Technol. B, 24(3), 1377 (2006)
- Clivia M. Sotomayor Torres, Alternative Lithography: Unleashing the Potentials of Nanotechnology, Kluwer Academic, 47 (2003)
- Colburn M, Johnson S, Stewart M, Damle S, Choi BJ, Bailey T, Wedlake M, Michaelson T, Sreenivasan SV, Ekert J, Willson CG, Proc. SPIE., 3676, 379 (1999)
- Costner EA, Lin MW, Jen W, Willson CG, Annu. Rev. Mater. Res., 39, 155 (2009)
- de Gennes, Brochard-Wyart PGF, Quere D, Capillarity and Wetting Phenomena: Drops, Bubbles, Pearls, Waves, Springer, New York (2004)
- Dumond J, Low HY, Adv. Mater., 20(7), 1291 (2008)
- Dumond JJ, Low HY, J. Vac. Sci. Technol. B., 30, 010801 (2012)
- Fagan MD, Kim BH, Yao DG, Adv. Polym. Technol., 28(4), 246 (2009)
- Gates BD, Xu QB, Stewart M, Ryan D, Willson CG, Whitesides GM, Chem. Rev., 105(4), 1171 (2005)
- Gourgon C, Perret C, Micouin G, Lazzarino F, Tortai JH, Joubert O, Grolier JPE, J. Vac. Sci. Technol. B, 21(1), 98 (2003)
- Guo LJ, Adv. Mater., 19(4), 495 (2007)
- Hong PS, Kim J, Lee HH, Appl. Phys. Lett., 88, 173105 (2006)
- Hu W, Yim EKF, Reano RM, Leong KW, Pang SW, J. Vac. Sci. Technol. B, 23(6), 2984 (2005)
- Huang T, Wu J, Yang S, Huang P, Chang S, Microelectron. Eng., 86, 615 (2009)
- Hwang JK, Cho S, Dang JM, Kwak EB, Song K, Moon J, Sung MM, Nat. Nanotechnol., 5(10), 742 (2010)
- Kim MJ, Song S, Lee HH, J. Micromech. Microeng., 16, 1700 (2006)
- Inannami R, Ojima T, Matsuki K, Kono T, Nakasugi T, Proc. SPIE., 83231J, 8323 (2012)
- Israelachvili J, Intermolecular & surface forces, Academic Press, London (1992)
- Jackman RJ, Duffy DC, Ostuni E, Willmore ND, Whitesides GM, Anal. Chem., 70, 2280 (1998)
- Jackson WB, Active-matrix backplanes produced by rollto-roll self aligned imprint lithography (SAIL), in: SID International Symposium Digest of Technical Papers, 39, 322 (2008)
- Jain A, Bonnecaze RT, J. Appl. Phys., 113, 234511 (2013)
- Jeans A, Almanza-Workman M, Cobene R, Elder R, Garcia R, Gomez-Pancorbo F, Jackson W, Jam M, Kim JJ, Eds., Proc. SPIE., 7637, 763719 (2010)
- Jung GY, Ganapathiappan S, Li X, Ohlberg DAA, Olynick DL, Chen Y, Tong WM, Williams RS, Appl. Phys. A: Mater.Sci. & Process., 78, 1169 (2004)
- Jung Y, Cheng X, J. Micromech. Microeng., 22, 085011 (2012)
- Kam AP, Seekamp J, Solovyev V, Cedeno CC, Goldschmidt A, Torres CMS, Microelectron. Eng., 73-74, 809 (2004)
- Kang MG, Park HJ, Ahn SH, Guo LJ, Sol. Energy Mater. Sol. Cells, 94(6), 1179 (2010)
- Kao PC, Chu SY, Zhan CY, Hsu LC, Liao WC, J. Vac. Sci. Technol. B, 24(3), 1278 (2006)
- Kao YC, Hong FCN, J. Micromech.Microeng., 21, 025026 (2011)
- Kim E, Xia YN, Whitesides GM, Nature, 376(6541), 581 (1995)
- Kim E, Xia YN, Zhao XM, Whitesides GM, Adv. Mater., 9(8), 651 (1997)
- Kim K, Jeong J, Sim Y, Lee E, Microelectron. Eng., 83, 847 (2006)
- Kim MJ, Song S, Kwon SJ, Lee HH, J. Phys.Chem. C., 111, 1140 (2007)
- Kim YS, Suh KV, Lee HH, Appl. Phys. Lett., 79, 2285 (2001)
- Kim YS, Park J, Lee HH, Appl. Phys. Lett., 81, 1011 (2002)
- Kim YS, Lee HH, Hammond PT, Nanotechnology., 14, 1140 (2003)
- Kiyohara S, Fujiwara M, Matsubayashi F, Mori K, Jpn. J. Appl.Phys. Part 1., 44, 3686 (2005)
- Lee H, Jung GY, Microelectron. Eng., 77, 42 (2005)
- Leising G, Stadlober B, Haas U, Haase A, Palfinger C, Gold H, Jakopic G, Microelectron. Eng., 83, 831 (2006)
- Liao WC, Hsu SLC, J. Vac. Sci. Technol. B, 22(6), 2764 (2004)
- Lim H, Choi KB, Kim G, Park S, Ryu J, Lee J, Microelectron. Eng., 88, 2017 (2011)
- Mele E, Benedetto FD, Persano L, Cingolani R, Pisignano D, Nano Lett., 5, 1915 (2005)
- Park H, Cheng X, Nanotechnology., 20, 245308 (2009)
- Pisignano D, Melcarne A, Mangiullo D, Cingolani R, Gigli G, J. Vac. Sci. Technol. B, 22(1), 185 (2004)
- Rogers JA, Meier M, Dodabalapur A, Appl. Phys.Lett., 73, 1766 (1998)
- Rogers JA, Nuzzo RG, Mater. Today., 8, 50 (2005)
- Rogers JA, Lee HH, Unconventional Nanopatterning Techniques and Applications, Wiley, New Jersey (2009)
- Rolland JP, Hagberg EC, Denison GM, Carter KR, de Simone JM, Angew. Chem. Int. Edn., 43, 5796 (2004)
- Schulz H, Wissen M, Scheer HC, Microelectron. Eng., 67-68, 657 (2003)
- Seo SM, Kim TI, Lee HH, Microelectron. Eng., 84, 567 (2007)
- Stuart C, Chen Y, ACS Nano., 3, 2062 (2009)
- Suh D, Choi SJ, Lee HH, Adv. Mater., 17(12), 1554 (2005)
- Suh KY, Kim YS, Lee HH, Adv. Mater., 13(18), 1386 (2001)
- Suh KY, Park J, Lee HH, J. Chem. Phys., 116(17), 7714 (2002)
- Tan H, Gilbertson A, Chou SY, J. Vac. Sci. Technol. B, 16(6), 3926 (1998)
- Vig AL, Makela T, Majander P, Lambertini V, Ahopelto J, Kristensen A, J. Micromech. Microeng., 21, 035006 (2011)
- Williams SS, Retterer S, Lopez R, Ruiz R, Samulski ET, de Simone JM, Nano Lett., 10, 1421 (2010)
- Wu JT, Yang SY, J. Micromech. Microeng., 20, 085038 (2010)
- Xia YN, Whitesides GM, J. Am. Chem. Soc., 117(11), 3274 (1995)
- Xia Y, Whitesides GM, Chem. Int. Ed., 37, 550 (1998)
- Xia YN, Rogers JA, Paul KE, Whitesides GM, Chem. Rev., 99(7), 1823 (1999)
- Yang KY, Yoon KM, Kim JW, Lee JH, Lee H, Jpn. J. Appl. Phys., 48, 095003 (2009)
- Yeo LP, Ng SH, Wang ZF, Xia HM, Wang ZP, Thang VS, Zhong ZW, de Rooij WF, J. Micromech. Microeng., 20, 015017 (2010)
- Yoon H, Lee KM, Khang DY, Lee HH, Choi SJ, Appl. Phys. Lett., 85, 1793 (2004)
- Yoon H, Choi MK, Suh KY, Char K, J. Colloid Interface Sci., 346(2), 476 (2010)
- Yoon H, Lee SH, Sung SH, Suh KY, Char K, Langmuir, 27(12), 7944 (2011)
- Youn SW, Iwara M, Goto H, Takahashi M, Maeda R, J. Mater. Process. Technol., 202, 76 (2008)
- Yun D, Son Y, Kyung J, Park H, Park C, Lee S, Rev. Sci. Instrum., 83, 015108 (2012)
- Zaumseil J, Meitl MA, Hsu JWP, Acharya BR, Baldwin KW, Loo YL, Rogers JA, Nano Lett., 3, 1223 (2003)