We present a procedure for removal and detoxification of chemical warfare agents (CWA) from corrosion-sensitive components using their reactive sorption (adsorption and bond cleavage). The procedure consists of spraying a suspended sorbent over a contaminated surface followed by mechanical removal of the spent sorbent after liquid phase evaporation. The procedure was tested using a video graphics array (VGA computer card) VGA card, sulfur mustard (yperite, HD agent, bis(2-chloroethyl)sulfide), and Zr4+-doped TiO2 sorbent obtained by homogeneous hydrolysis. After 60 min of interaction with a suspension of the reactive sorbent with the contaminated VGA card, 99.3% of the sulfur mustard was removed, while the VGA card retained its functionality. The procedure does not require specialized instrumentation. This is feasible for electronic devices, as they do not need corrosive and electrically conducting agents or nonvolatile solvents that would harm electronic circuits. The method would be applicable to decontamination of a broad range of CWAs and pesticides.