Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface

Salluzzo M; Gariglio S; Torrelles X; Ristic Z; Di Capua R; Drnec J; Sala MM; Ghiringhelli G; Felici R; Brookes NB

Advanced Materials, Vol.25, No.16, 2333-2338, 2013

DOI10.1002/adma.201204555 Export Citation

Structural and Electronic Reconstructions at the LaAlO3/SrTiO3 Interface

Salluzzo M, Gariglio S, Torrelles X, Ristic Z, Di Capua R, Drnec J, Sala MM, Ghiringhelli G, Felici R, Brookes NB

A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.

Keywords:polar oxide interfaces;LAO;STO;two-dimensional electron gas (2DEG);X-ray absorption spectroscopy;surface diffraction