X-ray amorphous V2AlC and hexagonal (V,Al)(2)C-x thin films were synthesized by magnetron sputtering from a compound target with the composition of V2AlC The crystallization kinetics was investigated by differential scanning calorimetry (DSC) and X-ray diffraction (XRD). During continuous heating up to 1200 degrees C, one exothermal peak is observed between 565 and 675 degrees C. XRD data suggest that the DSC peak is associated with the formation of V2AlC. The activation energy of crystallization of V2AlC is -308 kJ/mol based on the Kissinger approach. This value is close to the 287 kJ/mol activation energy obtained here for the transformation of magnetron sputtered (V,Al)(2)C-x thin films to V2AlC. The here reported phase formation temperature of V2AlC is about 800 degrees C lower than during hot pressing of elemental powders. (C) 2011 Elsevier B.V. All rights reserved.