Thin Solid Films, Vol.519, No.23, 8410-8413, 2011
Electronic structure of Co islands grown on the root 3 x root 3-Ag/Ge(111) surface
By means of room temperature scanning tunneling spectroscopy (RT STS), we have studied the electronic structure of two different Ag/Ge(111) phases as well as Co islands grown on the root 3 x root 3-Ag/Ge (111) forming either root 13 x root 13 or 2 x 2 patterns. The spectrum obtained from 4 x 4-Ag/Ge(111) structure shows the existence of a shoulder at 0.7 V which is also present in the electronic structure of the Ge(111)-c2 x 8 and indicates donation of Ge electrons to electronic states of the Ag-driven phase. However, this fact is not supported by the electronic spectrum taken from the root 3 x root 3-Ag/Ge (111). The complexity of the Co-root 13 x root 13 islands bonding with the substrate is mirrored by a large number of peaks in their electronic spectra. The spectra obtained from the Co-2 x 2 islands which had grown on the step differ from those taken from Co-2 x 2 islands located along the edge of the terrace by a number of peaks at negative sample bias. This discrepancy is elucidated in terms of dissimilarities of Co-substrate interaction accompanying Co islands growth on different areas of the stepped surface. (C) 2011 Elsevier B.V. All rights reserved.