Thin Solid Films, Vol.519, No.9, 2694-2697, 2011
Combination of synchrotron ellipsometry and table-top optical measurements for determination of band structure of DLC films
Model of the DLC band structure that took into account valence to conduction band transitions, pi ->pi* and sigma ->sigma*, and valence to extended states transitions sigma-xi* was confirmed by using the synchrotron ellipsometry at BESSY II in the range 5-30 eV combined with table-top ellipsometry and spectrophotometry in UV-IR range. The range up to 30 eV covered all the transitions from valence to conduction bands because the maximum energy transition of it pi ->pi* and sigma ->sigma* were 9.03 and 28.1 eV, respectively. The band gaps of these transitions were 0.75 and 4.74 eV, respectively. (C) 2011 Elsevier B.V. All rights reserved.