Thin Solid Films, Vol.518, No.24, 7425-7428, 2010
Investigations for InAs/GaAs multilayered quantum-dot structure treated by high energy proton irradiation
This paper focuses on the high energy proton irradiation effect of InAs/GaAs multilayers quantum-dot (QD) wafer and photodetector. With high energy proton path simulation, the releases of proton energy and trap distribution in QD multilayers are predicted well. Treated by 1 and 3 MeV protons, all protons almost penetrate the multilayers of QD structures and stop deeply in GaAs substrate. InAs QD multilayer structures/Infrared photodetector have been irradiated by protons with different energies (1 and 3 MeV) and doses (1 x 10(9)similar to 1 x 10(13) protons/cm(2)). The photoluminescence (PL) and photoresponsivity (PR) spectrum of samples were measured and discussed with as grown and post irradiation. (C) 2010 Elsevier B.V. All rights reserved.
Keywords:Proton irradiation;Quantum-dot infrared photodetector (QDIP);Metal organic chemical vapour deposition (MOCVD);Transport of ions in matter (TRIM);Stopping and range of ions in matter (SRIM)