Previous Article Next Article Table of Contents Thin Solid Films, Vol.517, No.15, 4491-4491, 2009 DOI10.1016/j.tsf.2009.01.028 Export Citation Spectroscopic ellipsometry characterization of polymer-fullerene blend films (vol 517, pg 1047, 2008) Ng AMC, Cheung KY, Fung MK, Djurisic AB, Chan WK Please enable JavaScript to view the comments powered by Disqus.
