The effects of LaNiO3 (LNO) and Pt electrodes on the properties of Pb(Zr-x, Ti1-x)O-3 (PZT) films were compared. Both LNO and PZT were prepared by chemical solution deposition (CSD) methods. Specifically, the microstructure of LNO and its influence on the PZT properties were studied as a function of PbO excess. Conditions to minimize the Pyrochlore phase and porosity were found. Remnant polarization, coercive field and fatigue limit were improved in the PZT/LNO films relative to the PZT/Pt films. Additionally, the PZT crystallization temperature over LNO was 500 degrees C, about similar to 50 degrees C lower than over Pt. The crystallization temperature reported here is amongst the lowest values for CSD-based PZT films. (C) 2008 Elsevier B.V. All rights reserved.