Solar Energy Materials and Solar Cells, Vol.87, No.1-4, 583-593, 2005
Control of random texture of monocrystalline silicon cells by angle-resolved optical reflectance
Light reflectance patterns in chemically textured (100)Si wafers exhibit 4-fold symmetry with intensity maxima at well-defined off centre angular positions. The relation between the light pattern and the geometrical features of the texture is discussed. A method that relates the reflected intensities with the texture degree is developed and tested. (c) 2004 Elsevier B.V. All rights reserved.