화학공학소재연구정보센터
Journal of Applied Polymer Science, Vol.66, No.2, 405-408, 1997
PIXE Analysis of Silk
The method of proton-induced X-ray emission (PIXE) was first utilized to analyze the elements in silk. Different kinds of silk from home and the wild were examined. The results show that every silk, besides C, H, O, and N, contains many types of elements such as Si, P, S, Ca, Mn, Fe, Cu, Zn, and Sr and different samples have different relative contents.