We report the effect of film thickness on transport and magnetotransport in La0.7Pb0.3MnO3 (LPMO) manganite films grown on single crystalline LaAlO3 substrate using chemical solution deposition (CSD) technique. AFM measurements show the island type grain growth responsible for the strain at the film-substrate interface, while structural studies using XRD shows the presence of thickness dependent compressive strain in the films which modifies the transport and magnetotransport in LPMO/LAOfilms. The observation of low temperature resistivity minima behavior in all the LPMO films has been explained in the context of electron-electron scattering mechanism. The ZFC-FC magnetization measurements show the glassy state behavior below T-min. (C) 2011 Elsevier Ltd. All rights reserved.