Advanced Materials
Advanced Materials, Vol.23, No.3 Entire volume, number list
ISSN: 0935-9648 (Print)
In this Issue (10 articles)
317 - 318 |
Advancing Technology Through Measurement Science in the NIST Polymers Division Lin EK, Cicerone M |
319 - 337 |
Molecular Characterization of Organic Electronic Films DeLongchamp DM, Kline RJ, Fischer DA, Richter LJ, Toney MF |
338 - 348 |
Carbon Nanotubes: Measuring Dispersion and Length Fagan JA, Bauer BJ, Hobbie EK, Becker ML, Walker ARH, Simpson JR, Chun J, Obrzut J, Bajpai V, Phelan FR, Simien D, Huh JY, Migler KB |
349 - 368 |
Surface Wrinkling: A Versatile Platform for Measuring Thin-Film Properties Chung JY, Nolte AJ, Stafford CM |
369 - 387 |
Combinatorial and High-Throughput Screening of Biomaterials Simon CG, Lin-Gibson S |
388 - 408 |
Photoresist Latent and Developer Images as Probed by Neutron Reflectivity Methods Prabhu VM, Kang SH, VanderHart DL, Satija SK, Lin EK, Wu WL |
409 - 413 |
Controlled In Situ Nanocavitation in Polymeric Materials Cheng YJ, Antonucci JM, Hudson SD, Lin NJ, Zhang XR, Lin-Gibson S |
414 - 420 |
Cubic Silsesquioxanes as a Green, High-Performance Mold Material for Nanoimprint Lithography Ro HW, Popova V, Chen L, Forster AM, Ding YF, Alvine KJ, Krug DJ, Laine RM, Soles CL |
421 - 425 |
Thermodynamic Underpinnings of Cell Alignment on Controlled Topographies Ding YF, Sun JR, Ro HW, Wang Z, Zhou J, Lin NJ, Cicerone MT, Soles CL, Lin-Gibson S |
426 - 432 |
Interfacial Rheology Through Microfluidics Martin JD, Marhefka JN, Migler KB, Hudson SD |