2759 - 2759 |
Proceedings of the 2nd International Symposium on Growth of III Nitrides Syuzennji, Japan 7-9 July, 2008 Preface Koukitu A, Amano H, Fujioka H |
2761 - 2766 |
Growth of InN films and nanostructures by MOVPE Briot O, Ruffenach S, Moret M, Gil B, Giesen C, Heuken M, Rushworth S, Leese T, Succi M |
2767 - 2771 |
Electron-carrier generation by edge dislocations in InN films: First-principles study Takei Y, Nakayama T |
2772 - 2775 |
First principles studies on In-related nitride semiconductors Obata T, Iwata J, Shiraishi K, Oshiyama A |
2776 - 2779 |
In-situ cyclic pulse annealing of InN on AlN/Si during IR-lamp-heated MBE growth Suzuki A, Bungi Y, Araki T, Nanishi Y, Mori Y, Yamamoto H, Harima H |
2780 - 2782 |
Growth and characterization of N-polar and In-polar InN films by RF-MBE Yamaguchi T, Muto D, Araki T, Nanishi Y |
2783 - 2786 |
Heteroepitaxial growth of InN layers on (111) silicon substrates Guo QX, Ogata M, Ding Y, Tanaka T, Nishio M |
2787 - 2790 |
MOVPE growth of InN buffer layers on sapphire Briot O, Ruffenach S, Moret M, Gil B, Giesen C, Heuken M, Rushworth S, Leese T, Succi M |
2791 - 2794 |
Alternative precursors for MOVPE growth of InN and GaN at low temperature Ruffenach S, Moret M, Briot O, Gil B, Giesen C, Heuken M, Rushworth S, Leese T, Succi M |
2795 - 2797 |
Optical, structural investigations and band-gap bowing parameter of GaInN alloys Moret M, Gil B, Ruffenach S, Briot O, Giesen C, Heuken M, Rushworth S, Leese T, Succi M |
2798 - 2801 |
InN excitonic deformation potentials determined experimentally Gil B, Moret M, Briot O, Ruffenach S, Giesen C, Heuken M, Rushworth S, Leese T, Succi M |
2802 - 2805 |
MOVPE growth of InN films using 1,1-dimethylhydrazine as a nitrogen precursor Thieu QT, Seki Y, Kuboya S, Katayama R, Onabe K |
2806 - 2808 |
Crystal growth of InN by MOCVD with electric field along the c-axis Ota Y, Biswas R, Higo M, Inushima T |
2809 - 2812 |
Selective area metal-organic vapor-phase epitaxy of InN, GaN and InGaN covering whole composition range Shioda T, Sugiyama M, Shimogaki Y, Nakano Y |
2813 - 2816 |
Role of vapor-phase diffusion in selective-area MOVPE of InGaN/GaN MQWs Tomita Y, Shioda T, Sugiyama M, Shimogaki Y, Nakano Y |
2817 - 2820 |
Mg doping behavior of MOVPE InxGa1-xN (x similar to 0.4) Islam MR, Sugita K, Horie M, Hashimoto A, Yamamoto A |
2821 - 2824 |
Flow modulation effect on N incorporation into GaAs(1-x)Nx films during chemical beam epitaxy growth Suzuki H, Nishimura K, Saito K, Ohshita Y, Kojima N, Yamaguchi M |
2825 - 2830 |
MOVPE growth of single-crystal hexagonal AlN on cubic diamond Taniyasu Y, Kasu M |
2831 - 2833 |
Low-pressure HVPE growth of crack-free thick AlN on a trench-patterned AlN template Katagiri Y, Kishino S, Okuura K, Miyake H, Hiramatu K |
2834 - 2836 |
Growth characteristics of AlN on sapphire substrates by modified migration-enhanced epitaxy Banal RG, Funato M, Kawakami Y |
2837 - 2839 |
Preparation of a crack-free AlN template layer on sapphire substrate by hydride vapor-phase epitaxy at 1450 degrees C Tajima J, Murakami H, Kumagai Y, Takada K, Koukitu A |
2840 - 2843 |
MOVPE of AlN-free hexagonal GaN/cubic SiC/Si heterostructures for vertical devices Komiyama J, Abe Y, Suzuki S, Nakanishi H, Koukitu A |
2844 - 2846 |
Formation of AlN layer on (111)Al substrate by ammonia nitridation Honda T, Yamamoto H, Sawadaishi M, Taguchi S, Sasaya K |
2847 - 2849 |
AlGaN epitaxial lateral overgrowth on Ti-evaporated GaN/sapphire substrate Matsuoka R, Okimoto T, Nishino K, Naoi Y, Sakai S |
2850 - 2852 |
Relaxation and recovery processes of AlxGa1-xN grown on AlN underlying layer Asai T, Nagata K, Mori T, Nagamatsu K, Iwaya M, Kamiyama S, Amano H, Akasaki I |
2853 - 2856 |
Characterizations of GaN films and AlGaN/GaN heterostructures on vicinal sapphire (0001) substrates grown by MOCVD Shen XQ, Shimizu M, Okumura H, Xu FJ, Shen B, Zhang GY |
2857 - 2859 |
Effect of the AlGaN electron blocking layer thickness on the performance of AlGaN-based ultraviolet light-emitting diodes Lee KB, Parbrook PJ, Wang T, Bai J, Ranalli F, Airey RJ, Hill G |
2860 - 2863 |
Novel UV devices on high-quality AlGaN using grooved underlying layer Tsuzuki H, Mori F, Takeda K, Iwaya M, Kamiyama S, Amano H, Akasaki I, Yoshida H, Kuwabara M, Yamashita Y, Kan H |
2864 - 2866 |
Pseudomorphic growth of thick n-type AlxGa1-xN layers on low-defect-density bulk AlN substrates for UV LED applications Grandusky JR, Smart JA, Mendrick MC, Schowalter LJ, Chen KX, Schubert EF |
2867 - 2874 |
Growth and properties of semi-polar GaN on a patterned silicon substrate Sawaki N, Hikosaka T, Koide N, Tanaka S, Honda Y, Yamaguchi M |
2875 - 2878 |
HVPE growth of semi-polar (11(2)over-bar2)GaN on GaN template (113)Si substrate Suzuki N, Uchida T, Tanikawa T, Hikosaka T, Honda Y, Yamaguchi M, Sawaki N |
2879 - 2882 |
Reduction of dislocations in a (11(2)over-bar2)GaN grown by selective MOVPE on (113)Si Tanikawa T, Kagohashi Y, Honda Y, Yamaguchi M, Sawaki N |
2883 - 2886 |
Mg segregation in a (1(1)over-bar01) GaN grown on a 7 degrees off-axis (001) Si substrate by MOVPE Tomita K, Hikosaka T, Kachi T, Sawaki N |
2887 - 2890 |
One-sidewall-seeded epitaxial lateral overgrowth of a-plane GaN by metalorganic vapor-phase epitaxy Iida D, Iwaya M, Kamiyama S, Amano H, Akasaki I |
2891 - 2894 |
MOVPE growth and properties of GaN on (111)Si using an AlInN intermediate layer Irie M, Koide N, Honda Y, Yamaguchi M, Sawaki N |
2895 - 2898 |
Epitaxial lateral overgrowth on (2(1)over-bar(1)over-bar0) a-plane GaN with [0(1)over-bar11]-oriented stripes Wernicke T, Zeimer U, Netzel C, Brunner F, Knauer A, Weyers M, Kneissl M |
2899 - 2902 |
Structural and electrical properties of Si-doped a-plane GaN grown on r-plane sapphire by MOVPE Ma B, Miyagawa R, Hu WG, Li DB, Miyake H, Hiramatsu K |
2903 - 2905 |
Optical properties of MOVPE-grown a-plane GaN and AlGaN Narukawa M, Miyagawa R, Ma B, Miyake H, Hiramatsu K |
2906 - 2909 |
Photoluminescence study of Si-doped a-plane GaN grown by MOVPE Li DB, Ma B, Miyagawa R, Hu WG, Narukawa M, Miyake H, Hiramatsu K |
2910 - 2913 |
Fabrication of freestanding m-plane GaN wafer by using the HVPE technique on an aluminum carbide buffer layer on an m-plane sapphire substrate Sasaki H, Sunakawa H, Sumi N, Yamamoto K, Usui A |
2914 - 2918 |
Maskless selective growth of semi-polar (11(2)over-bar2) GaN on Si (311) substrate by metal organic vapor phase epitaxy Yang M, Ahn HS, Tanikawa T, Honda Y, Yamaguchi M, Sawaki N |
2919 - 2922 |
Optical characteristics of m-plane InGaN/GaN multiple quantum well grown on LiAlO2 (100) by MOVPE Hang DR, Chou MMC, Chang LW, Lin JL, Heuken M |
2923 - 2925 |
Electrical properties and deep traps spectra in undoped M-plane GaN films prepared by standard MOCVD and by selective lateral overgrowth Polyakov AY, Smirnov NB, Govorkov AN, Markov AN, Yakimov EB, Vergeles PS, Amano H, Kawashima T |
2926 - 2928 |
Growth of thick GaInN on grooved (10(1)over-bar(1)over-bar) GaN/(10(1)over-bar(2)over-bar) 4H-SiC Matsubara T, Senda R, Iida D, Iwaya M, Kamiyama S, Amano H, Akasaki I |
2929 - 2932 |
InGaN growth with various InN mole fractions on m-plane ZnO substrate by metalorganic vapor phase epitaxy Kawai Y, Ohsuka S, Iwaya M, Kamiyama S, Amano H, Akasaki I |
2933 - 2936 |
Quality and thermal stability of thin InGaN films Queren D, Schillgalies M, Avramescu A, Bruderl G, Laubsch A, Lutgen S, Strauss U |
2937 - 2941 |
Growth and characterization of green GaInN-based light emitting diodes on free-standing non-polar GaN templates Detchprohm T, Zhu M, Li Y, Xia Y, Liu L, Hanser D, Wetzel C |
2942 - 2947 |
Characterization of GaInN/GaN layers for green emitting laser diodes Wetzel C, Li YF, Senawiratne J, Zhu MW, Xia Y, Tomasulo S, Persans PD, Liu LZ, Hanser D, Detchprohm T |
2948 - 2952 |
N-face GaN growth on c-plane sapphire by metalorganic chemical vapor deposition Sun Q, Cho YS, Kong BH, Cho HK, Ko TS, Yerino CD, Lee IH, Han J |
2953 - 2955 |
Nucleation characteristics of GaN nanorods grown on etched sapphire substrates by hydride vapor phase epitaxy Sohn Y, Kim C |
2956 - 2961 |
Overgrowth of GaN on Be-doped coalesced GaN nanocolumn layer by rf-plasma-assisted molecular-beam epitaxy-Formation of high-quality GaN microcolumns Kato K, Kishino K, Sekiguchi H, Kikuchi A |
2962 - 2965 |
Crystal growth and characterization of GaCrN nanorods on Si substrate Tambo H, Kimura S, Yamauchi Y, Hiromura Y, Zhou YK, Emura S, Hasegawa S, Asahi H |
2966 - 2969 |
Formation of gallium nitride particles during the two-stage chemical vapor process Komoda H, Mori T, Kominami H, Nakanishi Y, Hara K |
2970 - 2972 |
Growth of undoped and Zn-doped GaN nanowires Narukawa M, Koide S, Miyake H, Hiramatsu K |
2973 - 2976 |
Pattern-size dependence of characteristics of nitride-based LEDs grown on patterned sapphire substrates Su YK, Chen JJ, Lin CL, Chen SM, Li WL, Kao CC |
2977 - 2981 |
Effects of morphologies on the field emission characteristics of GaN nanorods grown on Si (001) by MBE Seo J, Hasegawa S, Asahi H |
2982 - 2986 |
Nature of luminescence and strain in gallium nitride nanowires Mastro MA, Maximenko S, Gowda M, Simpkins BS, Pehrsson PE, Long JP, Makinen AJ, Freitas JA, Hite JK, Eddy CR, Kim J |
2987 - 2991 |
Measurement of nitrogen atomic flux for RF-MBE growth of GaN and AlN on Si substrates Ohachi T, Yamabe N, Shimomura H, Shimamura T, Ariyada O, Wada M |
2992 - 2995 |
Influence of substrate temperature on nitridation of (001) GaAs using RF-radical source Naritsuka S, Mori M, Takeuchi Y, Maruyama T |
2996 - 2999 |
GaN-based nitride semiconductor films deposited on nitrified HfO2/Si substrate by molecular beam epitaxy Hu FR, Sameshima H, Wakui M, Ito R, Hane K |
3000 - 3002 |
Low-temperature characteristics of the current gain of GaN/InGaN double-heterojunction bipolar transistors Nishikawa A, Kumakura K, Kasu M, Makimoto T |
3003 - 3006 |
Low-frequency noise characteristics of GaN-based UV photodiodes with AlN/GaN buffer layers prepared on Si substrates Chang SP, Chang SJ, Lu CY, Chiou YZ, Chuang RW, Lin HC |
3007 - 3010 |
Improved hot-wall MOCVD growth of highly uniform AlGaN/GaN/HEMT structures Forsberg U, Lundskog A, Kakanakova-Georgieva A, Ciechonski R, Janzen E |
3011 - 3014 |
Bulk GaN crystals grown by HVPE Fujito K, Kubo S, Nagaoka H, Mochizuki T, Namita H, Nagao S |
3015 - 3018 |
Bulk ammonothermal GaN Dwilinski R, Doradzinski R, Garczynski J, Sierzputowski LP, Puchalski A, Kanbara Y, Yagi K, Minakuchi H, Hayashi H |
3019 - 3024 |
Growth of GaN single crystals with extremely low dislocation density by two-step dislocation reduction Kawamura F, Tanpo M, Miyoshi N, Imade M, Yoshimura M, Mori Y, Kitaoka Y, Sasaki T |
3025 - 3028 |
Accelerated surface flattening by alternating Ga flow in hydride vapor phase epitaxy Lee S, Kim C |
3029 - 3032 |
Strain-reduced GaN thick-film grown by hydride vapor phase epitaxy utilizing dot air-bridged structure Huang HH, Chao CL, Chi TW, Chang YL, Liu PC, Tu LW, Tsay JD, Kuo HC, Cheng SJ, Lee WI |
3033 - 3036 |
Hydride vapor phase epitaxial growth of thick GaN layers with in-situ optical monitoring Wang JF, Hu XJ, Zhang YM, Xu Y, Wang HB, Zhang BS, Xu K, Yang H |
3037 - 3039 |
Effective reduction of bowing in free-standing GaN by N-face regrowth with hydride vapor-phase epitaxy Chen KM, Huang HH, Kuo YL, Wu PL, Chu TL, Yu HW, Lee WI |
3040 - 3043 |
Synthesis of GaN crystal by the reaction of Ga with Li3N in NH3 atmosphere Hirano T, Mabuchi A, Sugiura T, Minoura H |
3044 - 3048 |
Fabrication of a GaN lateral polarity junction by metalorganic chemical vapor deposition Mita S, Collazo R, Sitar Z |
3049 - 3053 |
Nitridation of Si(111) for growth of 2H-AlN(0001)/beta-Si3N4/Si(111) structure Yamabe N, Shimomura H, Shimamura T, Ohachi T |
3054 - 3057 |
Molecular beam epitaxial growth of hexagonal boron nitride on Ni(111) substrate Tsai CL, Kobayashi Y, Akasaka T, Kasu M |
3058 - 3062 |
Homoepitaxy on bulk ammonothermal GaN Dwilinski R, Doradzinski R, Garczynski J, Sierzputowski LP, Zajac M, Rudzinski M |
3063 - 3066 |
Defect reduction of laterally regrown GaN on GaN/patterned sapphire substrates Wuu DS, Wu HW, Chen ST, Tsai TY, Zheng XH, Horng RH |
3067 - 3074 |
A review of III-nitride research at the Center for Quantum Devices Razeghi M, McClintock R |
3075 - 3079 |
Point defects in group-III nitride semiconductors studied by positron annihilation Uedono A, Ishibashi S, Ohdaira T, Suzuki R |
3080 - 3084 |
High-resolution X-ray diffraction analysis on HVPE-grown thick GaN layers Liu JQ, Wang JF, Liu YF, Huang K, Hu XJ, Zhang YM, Xu Y, Xu K, Yang H |
3085 - 3088 |
Electron microscopy analysis of dislocation behavior in HVPE-AlGaN layer grown on a stripe-patterned (0001) sapphire substrate Kuwano N, Kugiyama Y, Nishikouri Y, Sato T, Usui A |
3089 - 3092 |
HRTEM investigation of high-reflectance AlN/GaN distributed Bragg-reflectors by inserting AlN/GaN superlattice Li ZY, Lu TC, Kuo HC, Wang SC, Lo MH, Lau KM |
3093 - 3096 |
An ab initio-based approach to the stability of GaN(0001) surfaces under Ga-rich conditions Ito T, Akiyama T, Nakamura K |
3097 - 3099 |
Relationship between defects and optical properties in Er-doped GaN Chen SQ, Uedono A, Seo J, Sawahata J, Akimoto K |
3100 - 3102 |
Expansion ratio dependence of lattice vibration of GaN using ab initio molecular dynamics calculations Uno K, Inoue T, Takizawa T, Tanaka I |
3103 - 3105 |
Theoretical investigation on the decomposition process of GaN(0001) surface under a hydrogen atmosphere Suzuki H, Togashi R, Murakami H, Kumagai Y, Koukitu A |
3106 - 3109 |
Theoretical approach to structural stability of c-GaN: How to grow cubic GaN Kangawa Y, Akiyama T, Ito T, Shiraishi K, Kakimoto K |
3110 - 3113 |
In situ gravimetric monitoring of surface reactions between sapphire and NH3 Akiyama K, Ishii Y, Murakami H, Kumagai Y, Koukitu A |