1 - 4 |
Selective area growth of a- and c-plane GaN nanocolumns by molecular beam epitaxy using colloidal nanolithography Bengoechea-Encabo A, Albert S, Sanchez-Garcia MA, Lopez LL, Estrade S, Rebled JM, Peiro F, Nataf G, de Merry P, Zuniga-Perez J, Calleja E |
5 - 11 |
Structural changes in precipitates and cell model for the conversion of amorphous calcium phosphate to hydroxyapatite during the initial stage of precipitation Zyman Z, Rokhmistrov D, Glushko V |
12 - 16 |
Optimizing seeded casting of mono-like silicon crystals through numerical simulation Black A, Medina J, Pineiro A, Dieguez E |
17 - 24 |
Top-view approach for in-situ observation of growth morphology in bulk transparent organic alloys Witusiewicz VT, Hecht U, Rex S |
25 - 30 |
Floating zone crystal growth and magnetic properties of bilayer manganites Pr(Sr1-xCax)(2)Mn2O7 Deng GC, Thiyagarajan R, Radheep DM, Pomjakushina E, Medarde M, Krzton-Maziopa A, Wang S, Arumugam S, Conder K |
31 - 34 |
Growth of Y123 bulk crystals in Y1.5Ba2Cu3Ox system with CeO2 addition Volochova D, Diko P, Radusovska M, Antal V, Piovarci S, Zmorayova K, Sefcikova M |
35 - 38 |
Effect of surface defects on InGaAs/InAlAs Quantum Cascade mesa current-voltage characteristics Aung NL, Huang X, Charles WO, Yao N, Gmachl CF |
39 - 46 |
Ga-assisted MBE growth of GaAs nanowires using thin HSQ layer Rieger T, Heiderich S, Lenk S, Lepsa MI, Grutzmacher D |
47 - 54 |
Investigation on structural, optical, morphological and electrical properties of thermally deposited lead selenide (PbSe) nanocrystalline thin films Shyju TS, Anandhi S, Sivakumar R, Garg SK, Gopalakrishnan R |
55 - 58 |
Study on defect properties of nanocrystalline TiO2 during phase transition by positron annihilation lifetime Zheng F, Liu Y, Liu Z, Dai YQ, Fang PF, Wang SJ |
59 - 62 |
Enhanced growth rate for ammonothermal gallium nitride crystal growth using ammonium iodide mineralizer Tomida D, Kagamitani Y, Bao Q, Hazu K, Sawayama H, Chichibu SF, Yokoyama C, Fukuda T, Ishiguro T |
63 - 67 |
Growth of single-crystalline Cu2O (111) film on ultrathin MgO modified alpha-Al2O3 (0001) substrate by molecular beam epitaxy Li JQ, Mei ZX, Ye DQ, Liang HL, Liu YP, Du XL |
68 - 71 |
Imaging extended non-homogeneities in HVPE grown GaN with Kelvin Probe Microscopy and photo-etching Nowak G, Weyher JL, Khachapuridze A, Grzegory I |
72 - 76 |
Growth and characterization of Nd:LGGG laser crystal Fu XW, Jia ZT, Li YB, Yuan DS, Dong CM, Tao XT |
77 - 82 |
Optical and morphological study of misoriented GaAs substrates exposed to bismuth flow using in situ spectral reflectance and atomic force microscopy Massoudi I, Habchi MM, Rebey A, El Jani B |
83 - 83 |
The effect of solvent ratio and water on the growth of C-60 nanowhiskers (vol 312, pg 2764, 2010) Miyazawa K, Hotta K |
84 - 87 |
Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation Jin XG, Nakahara H, Saitoh K, Saka T, Ujihara T, Tanaka N, Takeda Y |
88 - 94 |
Formation of V-grooves on the (Al,Ga)N surface as means of tensile stress relaxation Cheng K, Leys M, Degroote S, Bender H, Favia P, Borghs G, Germain M |
95 - 100 |
Enhancement of structural perfection of alkali halide single crystals by doping with copper Daniel DJ, Ramasamy P, Madhusoodanan U, Bhagavannarayana G |
101 - 107 |
Fabrication of BaCO3 sheaves tailored by carboxymethyl cellulose under compressed CO2 Shen DP, Li W, Xu SJ, Wu PY |
108 - 114 |
Nature and origin of V-defects present in metalorganic vapor phase epitaxy-grown (InxAl1-x)N layers as a function of InN content, layer thickness and growth parameters Vennegues P, Diaby BS, Kim-Chauveau H, Bodiou L, Schenk HPD, Frayssinet E, Martin RW, Watson IM |
115 - 119 |
Multi-technique analysis of high quality HPHT diamond crystal Fernandez-Lorenzo C, Araujo D, Gonzalez-Manas M, Martin J, Navas J, Alcantara R, Villar MP, Bagriantsev D |
120 - 123 |
Direct observation of extended dislocation in Cd0.9Zn0.1Te single crystals by HRTEM Sun J, Fu L |
124 - 128 |
Temperature dependence of crystalline SiGe growth on sapphire (0001) substrates by sputtering Kim HJ, Bae HB, Park Y, Lee K, Choi SH |
129 - 133 |
HVPE of AlxGa1-xN layers on planar and trench patterned sapphire Hagedorn S, Richter E, Zeimer U, Prasai D, John W, Weyers M |
134 - 139 |
The structure and electronic properties of AlN/SrTiO3 (111) interfaces Wang JL, Tang G, Wu XS, Gu MQ |
140 - 144 |
Transport properties of Sb-doped Si nanowires Nukala P, Sapkota G, Gali P, Philipose U |
145 - 151 |
Influence of impurities on the crystallization of dextrose monohydrate Markande A, Nezzal A, Fitzpatrick J, Aerts L, Redl A |
152 - 157 |
Thick orientation-patterned GaAs grown by low-pressure HVPE on fusion-bonded templates Lynch C, Bliss DF, Snure M, Tassev V, Bryant G, Yapp C, Fenner DB, Allen MG, Termkoa K, Li J, Vangala S, Goodhue W |
158 - 161 |
Vertical gradient freeze growth of ZnGeP2 crystals for nonlinear optical applications Wu HX, Wang ZY, Ni YB, Mao MS, Huang CB, Cheng XD |
162 - 167 |
Growth and characterization of Cr-doped semi-insulating GaN templates prepared by radio-frequency plasma-assisted molecular beam epitaxy Mei F, Yang ZJ, Xu JX, Wu LZ, Wu TZ, Zhang DM |
168 - 173 |
Morphology prediction of crystals grown in the presence of impurities and solvents - An evaluation of the state of the art Schmidt C, Ulrich J |
174 - 176 |
Diffusion boundary condition at surface steps Niu XB, Huang HC |