585 - 585 |
Special Issue of 4th Asian Particle Technology Symposium (APT 2009) - I Preface Pradip |
586 - 591 |
The promising aspects of processing nanomaterials under mechanical stressing for physicochemical viewpoints Senna M |
592 - 598 |
A direct method for porous particle density characterization applied to activated carbons Plantard G, Goetz V, Py X |
599 - 608 |
Innovations in high throughput manufacturing of uniform emulsions and capsules Yuan QC, Williams RA, Aryanti N |
609 - 613 |
Synthesis, characterization, electrical and sensing properties of ZnO nanoparticles Singh AK |
614 - 622 |
Investigation of the gas inlet velocity distribution in a fixed granular bed filter Hsu CJ, Hsiau SS, Chen YS, Smid J |
623 - 629 |
Scale-up methodology for tumbling ball mill based on impact energy of grinding balls using discrete element analysis Iwasaki T, Yabuuchi T, Nakagawa H, Watano S |
630 - 640 |
Three-dimensional simulation of the particle distribution in a downer using CFD-DEM and comparison with the results of ECT experiments Zhao T, Liu K, Cui YH, Takei M |
641 - 651 |
Dynamics of bi-dispersed settling suspension of non-colloidal particles in rotating cylinder Kumar AA, Singh A |
652 - 657 |
Agglomeration process of dry ice particles produced by expanding liquid carbon dioxide Liu YH, Maruyama H, Matsusaka S |
658 - 662 |
Studies on the processing of nickel base porous wicks for capillary pumped loop for thermal management of spacecrafts Mishra DK, Saravanan TT, Khanra GP, Girikumar S, Sharma SC, Sreekumar K, Sinha PP |
663 - 675 |
X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles Perfetti G, Van de Casteele E, Rieger B, Wildeboer WJ, Meesters GMH |
676 - 680 |
Estimation of particle size distribution from cross-sectional particle diameter on the cutting plane Akashi M, Otani T, Shimosaka A, Shirakawa Y, Hidaka J |
681 - 685 |
Development of a novel particle size control system for hammer milling Takeuchi H, Nakamura H, Iwasaki T, Asai N, Watano S |