177 - 184 |
Deoxidisation and phase analysis of plasma sprayed TiO2 by X-ray Rietveld method Wang XY, Liu Z, Liao H, Klein D, Coddet C |
185 - 190 |
A theoretical model on pore size distribution in low dielectric constant nanoporous silica films Hsu JP, Hung SH, Chen WC |
191 - 195 |
Synthesis and characterization of porous silsesquioxane dielectric films Yu S, Wong TKS, Hu X, Pita K |
196 - 200 |
Measuring film thickness using infrared imaging Decker CA, Mackin TJ |
201 - 207 |
Structural analysis of indium sulphide thin films elaborated by chemical bath deposition Yahmadi B, Kamoun N, Bennaceur R, Mnari M, Dachraoui M, Abdelkrim K |
208 - 212 |
Observation of phase transitions in chemical bath deposited copper selenide thin films through conductivity studies Pai RR, John TT, Lakshmi M, Vijayakumar KP, Kartha CS |
213 - 217 |
Further evidence on the observation of compositional fluctuation in silicon-germanium alloy nanocrystals prepared in anodized porous silicon-germanium films Kartopu G, Ekinci Y |
218 - 223 |
Ultraflat indium tin oxide films prepared by ion beam sputtering Han Y, Kim D, Cho JS, Koh SK |
224 - 229 |
Prediction of thin film thickness of field emission using wavelet neural networks Cui WZ, Zhu CC, Zhao HP |
230 - 235 |
On the optical properties of bismuth oxide thin films prepared by pulsed laser deposition Leontie L, Caraman M, Visinoiu A, Rusu GI |
236 - 240 |
Spontaneous oxide reduction in metal stacks Qin W, Volinsky AA, Werho D, Theodore ND, Kottke M, Ramiah C |
241 - 246 |
Thin polycrystalline zinc oxide films obtained by oxidation of metallic zinc films Alivov YI, Chernykh AV, Chukichev MV, Korotkov RY |
247 - 251 |
Diffusion and adhesion properties of Cu films on polyimide substrates Liang T, Liu YQ, Fu ZQ, Luo TY, Zhang KY |
252 - 258 |
Deposition and microstructure of Ti-containing diamond-like carbon nanocomposite films Yang WJ, Sekino T, Shim KB, Niihara K, Auh KH |
259 - 266 |
Thin polymer films prepared by plasma immersion ion implantation and deposition Rangel EC, Silva PAF, Mota RP, Schreiner WH, Cruz NC |
267 - 271 |
Growth and characterization of copper nanoclusters embedded in SiC matrix Shin DW, Wang SX, Marshall AF, Kimura W, Dong CL, Augustsson A, Guo JH |
272 - 277 |
Asymmetric silver to oxide adhesion in multilayers deposited on glass by sputtering Barthel E, Kerjan O, Nael P, Nadaud N |
278 - 295 |
Effective mechanical properties of layered rough surfaces Bhushan B, Venkatesan S |
296 - 299 |
Pulsed laser deposition optical waveguiding Bi3TiNbO9 thin films on fused silica Bin Y, Wang FY, Han JP, Chen YF, Zhu SN, Liu ZG, Cao WW |
300 - 307 |
Electronic and junction properties of poly(2,5-dimethoxyaniline)-polyethylene oxide blend/metal Schottky diodes Huang LM, Wen TC, Gopalan A |
308 - 314 |
Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy Ryan BJ, Lowney DP, Henry MO, McNally PJ, McGlynn E, Jacobs K, Considine L |
315 - 320 |
The electromagnetic interference shielding effect of indium-zinc oxide/silver alloy multilayered thin films Kim WM, Ku DY, Lee IK, Seo YW, Cheong BK, Lee TS, Kim IH, Lee KS |
321 - 327 |
Micro-structures of BF2+- and As+-implanted polycrystalline silicon thin films of various thicknesses and heat treatments Liou BW, Shu CC, Shui JW |
328 - 334 |
Integration of stacked capacitor module with ultra-thin ferroelectric SrBi2Ta2O9 film for high density ferroelectric random access memory applications at low voltage operation Moert M, Mikolajick T, Schindler G, Nagel N, Kasko I, Hartner W, Dehm C, Kohlstedt H, Waser R |
335 - 339 |
Thermal-stress stability of yttrium oxide as a buffer layer of metal-ferroelectric-insulator-semiconductor field effect transistor Lee CK, Kim WS, Park HH, Jeon H, Pae YH |
340 - 345 |
Deposition of titanium nitride films onto silicon by an ion beam assisted deposition method Yokota K, Nakamura K, Kasuya T, Mukai K, Ohnishi M |
346 - 350 |
Size effects and conductivity of ultrathin Cu films Fedorov DV, Zahn P, Mertig I |
351 - 356 |
A novel process to form a silica-like thin layer on polyethylene terephthalate film and its application for gas barrier Zhu PX, Teranishi M, Xiang JH, Masuda Y, Seo WS, Koumoto K |