4843 - 4845 |
Proceedings of the international symposium on dry process - DPS 2005 Fujiwara N, Stamate E, Yeom GY, Shiratani M, Chang HY, Economou DJ, Kusano E, Chang JP |
4846 - 4852 |
Plasma/reactor walls interactions in advanced gate etching processes Ramos R, Cunge G, Joubert O, Sadeghi N, Mori M, Vallier L |
4853 - 4859 |
Controlling the ion flux on substrates of different geometry by sheath-lens focusing effect Stamate E, Sugai H |
4860 - 4863 |
Laser-induced fluorescence ion diagnostics in light of plasma processing McWilliams R, Booth JP, Hudson EA, Thomas J, Zimmerman D |
4864 - 4868 |
Study of plasma charging-induced white pixel defect increase in CMOS active pixel sensor Tokashiki K, Bai K, Baek K, Kim Y, Min G, Kang C, Cho H, Moon J |
4869 - 4873 |
Plasma parameters in the vicinity of the quartz window of a low pressure surface wave discharge produced in O-2 Nakao S, Stamate E, Sugai H |
4874 - 4878 |
Profile simulation of high aspect ratio contact etch Kim D, Hudson EA, Cooperberg D, Edelberg E, Srinivasan M |
4879 - 4882 |
MD simulations of amorphous SiO2 thin film formation in reactive sputtering deposition processes Taguchi M, Hamaguchi S |
4883 - 4886 |
Molecular dynamics simulation analyses on injection angle dependence of SiO2 sputtering yields by fluorocarbon beams Kawase T, Hamaguchi S |
4887 - 4891 |
Investigation of the ion dose non-uniformity caused by sheath-lens focusing effect on silicon wafers Holtzer N, Stamate E, Toyoda H, Sugai H |
4892 - 4896 |
Threshold voltage shift of submicron p-channel MOSFET due to Si surface damage from plasma etching process Kim GH, Kang YR, Kim WJ, Kim SY, Kim CI |
4897 - 4900 |
Control of substrate surface temperature in millisecond annealing technique using thermal plasma jet Okada T, Higashi S, Kaku H, Koba N, Murakami H, Miyazaki S |
4901 - 4904 |
Fabrication and characteristics of out-of-plane piezoelectric micro grippers using MEMS processes Jeon CS, Park JS, Lee SY, Moon CW |
4905 - 4908 |
Atmospheric plasma-calcination of mesoporous tungsten oxide utilizing plasma dielectric barrier discharge Baroch P, Hieda J, Saito N, Takai O |
4909 - 4912 |
Change of the argon-based atmospheric pressure large area plasma characteristics by the helium and oxygen gas mixing Rhee JK, Kim DB, Moon SY, Choe W |
4913 - 4917 |
Feasibility study of material surface modification by millimeter size plasmas produced in a pin to plane electrode configuration Kim DB, Rhee JK, Moon SY, Choe W |
4918 - 4922 |
A novel deep etching technology for Si and quartz materials Morikawa Y, Koidesawa T, Hayashi T, Suu K |
4923 - 4927 |
Etching characteristics and modeling for oval-shaped contact Park SC, Lim SH, Shin CH, Min GJ, Kang CJ, Cho HK, Moon JT |
4928 - 4932 |
Improvement in gate LWR with plasma curing of ArF photoresists Ando A, Matsui E, Matsuzawa NN, Yamaguchi Y, Kugimiya K, Yoshida M, Salam KMA, Kusakabe T, Tatsumi T |
4933 - 4936 |
Control of oxidation on NiSix during etching and ashing processes Sakamori S, Yonekura K, Fujiwara N, Kosaka T, Ohkuni M, Tateiwa K |
4937 - 4940 |
Effects of radical-distribution control on etching-profile uniformity in dielectric etching Kobayashi H, Yokogawa K, Maeda K, Kanekiyo T, Izawa M |
4941 - 4944 |
Controlling gate-CD uniformity by means of a CD prediction model and wafer-temperature distribution control Kanno S, Miya G, Tanaka J, Masuda T, Kuwahara K, Sakaguchi M, Makino A, Tsubone T, Fujii T |
4945 - 4949 |
Chemical dry etching of silicon oxide in F-2/Ar remote plasmas Kang SC, Kim DJ, Hwang JY, Yun YB, Lee NE, Jang YC, Bae GH |
4950 - 4954 |
Effect of doping elements on ZnO etching characteristics with CH4/H-2/Ar plasma Shin MH, Park MS, Jung SH, Boo JH, Lee NE |
4955 - 4959 |
Dry etching of magnesium oxide thin films by using inductively coupled plasma for buffer layer of MFIS structure Kim GH, Kim CI |
4960 - 4965 |
Sacrificial CVD film etch-back process for air-gap Cu interconnects Uno S, Katsuyama K, Noguchi J, Sato K, Oshima T, Katsuyama M, Hara K |
4966 - 4970 |
Suppression of hydrogen-ion drift into underlying layers using plasma deposited silicon oxynitride film during high-density plasma chemical vapor deposition Murata T, Yamaguchi T, Sawada M, Shimizu S, Asai K, Kobayashi K, Miyatake H, Yoneda M |
4971 - 4974 |
Growth of crystallized ge films from VHF inductively-coupled plasma of H-2-diluted GeH4 Sakata T, Makihara K, Murakami H, Higashi S, Miyazaki S |
4975 - 4979 |
Epitaxial growth of lithium niobate film using metalorganic chemical vapor deposition Akiyama Y, Shitanaka K, Murakami H, Shin YS, Yoshida M, Imaishi N |
4980 - 4982 |
Ni-silicide precursor for gate electrodes Ishikawa M, Muramoto I, Machida H, Imai S, Ogura A, Ohshita Y |
4983 - 4987 |
High-speed mu c-Si films deposition and large-grain poly-Si films deposition by surface wave discharge Hotta Y, Toyoda H, Sugai H |
4988 - 4991 |
Improved crystallization characteristics of ZnO thin film grown onto a-C : H film used as a buffer layer Kim EK, Lee TY, Park YS, Ghosh S, Hong B, Kim YS, Song JT |
4992 - 4995 |
Growth of VO2 films with metal-insulator transition on silicon substrates in inductively coupled plasma-assisted sputtering Okimura K, Kubo N |
4996 - 4999 |
Sputter deposition and surface treatment of TiO2 films for dye-sensitized solar cells using reactive RF plasma Sung YM, Kim HJ |
5000 - 5003 |
Properties of plasma enhanced chemical vapor deposited silicon nitride for the application in multicrystalline silicon solar cells Yoo J, Dhungel SK, Yi J |
5004 - 5007 |
Refractive index and etched structure of silicon nitride waveguides fabricated by PECVD Yoon DH, Yoon SG, Kim YT |
5008 - 5011 |
Carbon incorporation process in GaAsN films grown by chemical beam epitaxy using MMHy or DMHy, as the N source Suzuki H, Nishimura K, Lee HS, Ohshita Y, Ima NK, Yamaguchi M |
5012 - 5018 |
Suppression of 193-nm photoresist deformation by H-2 addition to fluorocarbon plasma in via-hole etching Yonekura K, Yoshikawa K, Fujiwara Y, Sakamori S, Fujiwara N, Kosaka T, Ohkuni M, Tateiwa K |
5019 - 5024 |
Novel organosiloxane vapor annealing process for improving properties of porous low-k films Kohmura K, Tanaka H, Oike S, Murakami M, Fujii N, Takada S, Ono T, Seino Y, Kikkawa T |
5025 - 5030 |
Characterization and integration of new porous low-k dielectric (k < 2.3) for 65 nm technology and beyond Choi KK, Cho IH, Park SJ, Lim JE, Jung OJ, Park JH, Min BS, Hwang SB, Ko MJ, Lee JG |
5031 - 5034 |
Influences of atomic hydrogen on porous low-k dielectric for 45-nm node Tomioka K, Soda E, Kobayashi N, Takata M, Uda S, Ogushi K, Yuba Y, Akasaka Y |
5035 - 5039 |
The structures of low dielectric constant SiOC thin films prepared by direct and remote plasma enhanced chemical vapor deposition Heo J, Kim HJ, Han J, Shon JW |
5040 - 5044 |
Plasma enhanced chemical vapor deposition of low dielectric constant SiOC(-H) films using MTES/O-2 precursor Navamathavan R, Choi CK |
5045 - 5048 |
Effect of additive gases on the selective etching of ZrOx film using inductively coupled BCl3-based plasmas Park SD, Lim JH, Yeom GY |
5049 - 5053 |
Phase transition characteristics of Bi/Sn doped Ge2Sb2Te5 thin film for PRAM application Park TJ, Choi SY, Kang MJ |
5054 - 5058 |
Formation of (001)-textured grain in (111) polycrystalline silicon film Oh JH, Kim EH, Kang DH, Cheon JH, Kim KH, Jang J |
5059 - 5064 |
Electromagnetic sources of nonuniformity in large area capacitive reactors Howling AA, Sansonnens L, Hollenstein C |
5065 - 5069 |
Electrical characteristics of poly(3-hexylthiophene) organic thin film transistor with electroplated metal gate electrodes on polyimide Seol YG, Lee JG, Lee NE, Lee SS, Ahn J |
5070 - 5074 |
Synthesis and blue electrolurninescent properties of zinc (II) [2-(2-hydroxyphenyl)berizoxazole] Kim WS, You JM, Lee BJ, Jang YK, Kim DE, Kwon YS |
5075 - 5078 |
White OLEDs based on novel emissive materials such as Zn(HPB)(2) and Zn(HPB)q Jang YK, Kim DE, Kim WS, Kim BS, Kwon OK, Lee BJ, Kwon YS |
5079 - 5083 |
Theoretical study of a new phosphorescent iridium(III) quinazoline complex Lee YH, Kim YS |
5084 - 5089 |
Heteroleptic tris-cyclometalated iridium(III) complexes with phenylpridine and diphenylquinoline derivative ligands Park YH, Kim YS |
5090 - 5094 |
Efficient red-emitting phosphorescent iridium(III) complexes of fluorinated 2.4-diphenylquinolines Park GY, Kim YS, Ha YK |
5095 - 5098 |
Organic light-emitting devices with a mixed layer acting as a hole transport and as an emitting/electron transport layer Yoon YB, Kim TW, Yang HW, Kim JH, Seo JH, Kim YK |
5099 - 5102 |
Highly efficient organic light-emitting diodes fabricated utilizing nickel-oxide buffer layers between the anodes and the hole transport layers Im HC, Choo DC, Kim TW, Kim JH, Seo JH, Kim YK |
5103 - 5108 |
Optical and electrical properties of p-type transparent conducting CuAlO2 thin film Kim DS, Park SJ, Jeong EK, Lee HK, Choi SY |
5109 - 5112 |
HfO2 gate insulator formed by atomic layer deposition for thin-film-transistors Jeong SW, Lee HJ, Kim KS, You MT, Roh Y, Noguchi T, Xianyu W, Jung J |
5113 - 5117 |
Effects of SiO2 addition on discharge characteristics of the MgO protective layer in plasma display panel Lee HK, Kim JW, Park SJ, Choi SY |
5118 - 5122 |
Wall charge characteristics in accordance with square and ramped reset pulse in alternating current plasma display panels (AC-PDPs) Lee SB, Lee JH, Lee HJ, Moon MW, Oh PY, Song KB, Choi EH |
5123 - 5130 |
One-dimensional carbon and ZnO Ting JM, Liao KH, Chou TL |
5131 - 5135 |
Fabrication of dye sensitized solar cell using TiO2 coated carbon nanotubes Lee TY, Alegaonkar PS, Yoo JB |
5136 - 5141 |
Mechanical properties of electrospun PVA/MWNTs composite nanofibers Jeong JS, Moon JS, Jeon SY, Park JH, Alegaonkar PS, Yoo JB |
5142 - 5146 |
Field-emission characteristics of diamond-like amorphous carbon films deposited by mixed gas (N-2 or H-2) controlled i-C4H10 supermagnetron plasma Kinoshita H, Yamashita M |
5147 - 5152 |
Submicron optical near-field diffraction patterns obtained by irradiation of octadecyltrimethoxysilane self-assembled monolayers with light at 157 nm Nae FA, Saito N, Takai O |
5153 - 5157 |
Realization of various sub-micron metal patterns using room temperature nanoimprint lithography Sung JH, Lee MW, Lee SG, Park SG, Lee EH, O BH |
5158 - 5162 |
Bicrystalline gallium oxide nanobelts Kim HW, Shim SH |
5163 - 5166 |
Study on electrical conduction of viologen derivatives using scanning tunneling microscopy Lee NS, Shin HK, Qian DJ, Kwon YS |
5167 - 5171 |
Fabrication of nano-pillar chips by a plasma etching technique for fast DNA separation Ogawa R, Ogawa H, Oki A, Hashioka S, Horiike Y |
5172 - 5178 |
Surface modification of poly(dimethylsiloxane) for controlling biological cells' adhesion using a scanning radical microjet Tan HML, Fukuda H, Akagi T, Ichiki T |
5179 - 5183 |
Amperometric biosensor based on direct electrochemistry of hemoglobin in poly-allylamine (PAA) film Kafi AKM, Lee DY, Park SH, Kwon YS |
5184 - 5187 |
Controlled drug release using nanoporous anodic aluminum oxide on stent Kang HJ, Kim DJ, Park SJ, Yoo JB, Ryu YS |
5188 - 5192 |
Time evolution of electrode voltage distribution in large-area capacitively coupled plasmas Matsukuma M, Hamaguchi S |
5193 - 5196 |
Plasma and antenna characteristics of a linearly extended inductively coupled plasma system using multi-polar magnetic field Kim KN, Lim JH, Yeom GY |
5197 - 5201 |
The volt-ampere characteristics of a DC arc plasmatron with a distributed anode spot Lee HJ, Plaksin VY, Riaby VA |