1 - 6 |
Fabrication of diamond microstructures for microelectromechanical systems (MEMS) by a surface micromachining process Ramesham R |
7 - 10 |
H- ESD observed from beta-state NH3 adsorbed on Pt(111) Bater C, Campbell JH, Craig JH |
11 - 12 |
Electrosynthesis of the molybdenum disulphide thin films and characterization Patil RS |
13 - 17 |
Microstructure analyses of the titanium films formed by the ionized sputtering process Ko DH, Kim EH, Choi S, Yoo BY, Lee HD |
18 - 23 |
Chemical bath deposition of indium sulphide thin films: preparation and characterization Lokhande CD, Ennaoui A, Patil PS, Giersig M, Diesner K, Muller M, Tributsch H |
24 - 27 |
Temperature determination by solubility measurements and a study of evaporation of volatile components in LPE Mishurnyi VA, de Anda F, del Castillo ICH, Gorbatchev AY |
28 - 32 |
Field-lowering carrier excitation in cadmium arsenide thin films Din M, Gould RD |
33 - 39 |
Micro-scratch analysis and mechanical properties of plasma-deposited silicon-based coatings on polymer substrates Rats D, Hajek V, Martinu L |
40 - 44 |
Anisotropy in wear processes measured by scanning probe microscopy Schouterden K, Lairson BM |
45 - 52 |
Chemical vapor deposition of copper-cobalt binary films Gu S, Atanasova P, Hampden-Smith MJ, Kodas TT |
53 - 61 |
Fabrication and characterization of (1-x)SrBi2Ta2O9-xBi(3)TaTiO(9) layered structure solid solution thin films for ferroelectric random access memory (FRAM) applications Ryu SO, Tirumala S, Joshi PC, Desu SB |
62 - 67 |
Deposition of polymeric nitrogenated amorphous carbon films (a-C : H : N) using electron cyclotron resonance CVD Yoon SF, Rusli X, Ahn J, Zhang Q, Yang CY, Yang H, Watt F |
68 - 71 |
Quantitative analysis of the oxygen content in BaTiO3 films deposited by PLD using O-16(alpha,alpha)O-16 resonant elastic scattering Li W, Lu F, Liu ZG, Zhu Y, Wang FX, Liu XD, Tan CY, Wang KM |
72 - 76 |
Growth of yttria stabilized zirconia thin films by metallo-organic, ultrasonic spray pyrolysis Matsuzaki Y, Hishinuma M, Yasuda I |
77 - 86 |
Non-vacuum laser deposition of buffer layers for coated conductors Dahotre NB, Semak V, Xiao CH, McCay MH |
87 - 94 |
Ellipsometric analysis of the oxidation of alpha-Fe and epsilon-Fe2N1-x Graat PCJ, Somers MAJ, Mittemeijer EJ |
95 - 105 |
Structural characterization of CxByNz (x = 0.1 to x = 0.2) layers obtained by laser-driven synthesis Morjan I, Conde O, Oliveira M, Vasiliu F |
106 - 109 |
Separation of CO2 and CH4 through two types of polyimide membrane Zhang JY, Lu JJ, Liu WM, Xue QJ |
110 - 116 |
Influence of substrate temperature on atomic layer growth and properties of HfO2 thin films Aarik J, Aidla A, Kiisler AA, Uustare T, Sammelselg V |
117 - 124 |
Electrodeposition of CuInSe2 thin films in a glycine acid medium Ugarte R, Schrebler R, Cordova R, Dalchiele EA, Gomez H |
125 - 131 |
Preparation and photoelectrochemical properties of Ti1-xVxO2 solid solution thin film photoelectrodes with gradient bandgap Zhao GL, Kozuka H, Lin H, Takahashi M, Yoko T |
132 - 136 |
Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors Gao JX, Zheng LR, Duo XZ, Huang JP, Yang LX, Lin CL, Yan RL |
137 - 139 |
Preparation of AlN thin films by nitridation of Al-coated Si substrate Huang JP, Wang LW, Shen QW, Lin CL, Ostling M |
140 - 144 |
Epitaxial growth of RuO2 thin films by metal-organic chemical vapor deposition Lu P, He S, Li FX, Jia QX |
145 - 152 |
Intensity profiles along the RHEED streaks for various thin film surface morphologies Mae K, Moshchalkov VV, Bruynseraede Y |
153 - 158 |
Neutron and X-ray reflectivity analysis of ceramic-metal materials Gibaud A, Sella C, Maaza M, Sung L, Dura JA, Satija SK |
159 - 163 |
Correlation between the OES plasma composition and the diamond film properties during microwave PA-CVD with nitrogen addition Vandevelde T, Wu TD, Quaeyhaegens C, Vlekken J, D'Olieslaeger M, Stals L |
164 - 168 |
Electrical characterization of Ta2O5 films deposited by laser reactive ablation of metallic Ta Fu ZW, Len LY, Qin QZ |
169 - 174 |
A novel approach to the formation of amorphous carbon nitride film on silicon by ECR-CVD Sung SL, Tseng CH, Chiang FK, Guo XJ, Liu XW, Shih HC |
175 - 182 |
Growth and characterization of AP-MOCVD iron doped titanium dioxide thin films Gauthier V, Bourgeois S, Sibillot P, Maglione M, Sacilotti M |
183 - 188 |
AFM characterization of the structure of Au-colloid monolayers and their chemical etching Doron A, Joselevich E, Schlittner A, Willner I |
189 - 193 |
Effect of surfactant concentration on the size of coated ferromagnetic nanoparticles Prozorov T, Kataby G, Prozorov R, Gedanken A |
194 - 200 |
Abrasion of thin films deposited onto glass by the Taber test Suzuki S, Ando E |
201 - 204 |
Ion irradiation hardening of C-60 thin films Foerster CE, Lepienski CM, Serbena FC, Zawislak FC |
205 - 209 |
Stress formation and relaxation in amorphous Ta-Cr films Andersen P, Moske M, Dyrbye K, Bottiger J |
210 - 217 |
Micro/nanomechanical characterization of ceramic films for microdevices Li XD, Bhushan B |
218 - 220 |
Information storage based on photochemical effects in mixed Langmuir-Blodgett films Ricceri R, Abbotto A, Facchetti A, Pagani GA, Gabrielli G |
221 - 229 |
Conductivity mechanisms in poly(p-phenylene vinylene) light-emitting diodes at high and low bias Jones R, Krier A, Davidson K, Schmit JPN, Zawadzka J |
230 - 232 |
Enhanced luminescence of silica thin films co-doped with Er3+ and Yb3+ Gu G, Ong PP, Cai JH, Yang W, Du YW, Yang SH |
233 - 236 |
Refractive indices and thicknesses of optical waveguides fabricated by silicon ion implantation into silica glass Gazecki J, Kubica JM, Zamora M, Reeves GK, Johnson CM, Ridgway MC |
237 - 241 |
Electrical stability of polyimide siloxane films for interlayer dielectrics in multilevel interconnections Homma T, Yamaguchi M, Kutsuzawa Y, Otsuka N |
242 - 249 |
Drying temperature effects on microstructure, electrical properties and electro-optic coefficients of sol-gel derived PZT thin films Lee C, Spirin V, Song H, No K |
250 - 256 |
Charge migration on hydrophobic and hydrophilic silicon dioxide Hedborg E, Winquist F, Sundgren H, Lundstrom I |
257 - 261 |
X-ray photoelectron spectroscopy study of Langmuir-Blodgett films of N-octadecyl-8-hydroxy-2-quinoline carboxamide deposited from subphases containing metal ions Ouyang JM, Zheng WJ, Huang NX, Tai ZH |
262 - 264 |
Photoelectric responses of Langmuir-Blodgett film containing bacteriorhodopsin on ITO modified with polypyrrole film Yuan LS, Li BF, Jiang L |
265 - 270 |
Central metal effect on the organization of porphyrin LB films Liu HG, Feng XS, Xue QB, Wang L, Yang KZ |
271 - 273 |
The anisotropic gas response behavior of LB films of an amphiphilic asymmetrically substituted phthalocyanine Ding XM, Xu HJ, Zhang LG, Jiang DP, Lu A |
274 - 279 |
Selective ultrathin gold deposition by organometallic chemical vapor deposition onto organic self-assembled monolayers (SAMs) Wohlfart P, Weiss J, Kashammer J, Winter C, Scheumann V, Fischer RA, Mittler-Neher S |
280 - 287 |
Consequences of TiO2 doping on the optical properties of porous silica layers coated on silica optical fibers Abdelmalek F, Lacroix M, Chovelon JM, Jaffrezic-Renault N, Berkova D, Matejec V, Kasik I, Chomat M, Gagnaire H |
288 - 291 |
Effect of a noble metal coating on a natural aluminum oxide film. Kuzik LA, Yakovlev VA |
292 - 296 |
Ion transport studies on vacuum deposited PbSnI4 thin films Kuku TA |
297 - 300 |
Transport property of Sn-doped In0.5Ga0.5P layers grown by liquid phase epitaxy Yoon IT, Park HL |
301 - 305 |
On the interpretation of Fe-57 Mossbauer spectra from CdTe thin films with substitutions of Fe, In, and Sb Yee-Madeira H, Reguera E, Zelaya-Angel O, Montiel-Sanchez H, Sanchez-Sinencio F, Scorzelli RB |
306 - 316 |
Morphology of sputter deposited Al alloy films Onishi T, Iwamura E, Takagi K |
317 - 317 |
Experimental and numerical analysis of rapid reaction to initiate the radical chain reactions in WSix CVD (vol 320, pg 151, 1998) Chae YK, Egashira Y, Shimogaki Y, Sugawara K, Komiyama H |