1 - 10 |
Si/Si1-xGex and Si/Si1-yCy heterostructures: materials for high-speed field-effect transistors Schaffler F |
11 - 14 |
Carbon-containing group IV heterostructures on Si : properties and device applications Osten HJ, Barth R, Fischer G, Heinemann B, Knoll D, Lippert G, Rucker H, Schley P, Ropke W |
15 - 20 |
Optimization of growth conditions for strained Si/Si1-yCy structures Joelsson KB, Ni WX, Pozina G, Hultman L, Hansson GV |
21 - 25 |
Optimized processing for differentially molecular beam epitaxy-grown SiGe(C) devices Lippert G, Osten HJ, Blum K, Sorge R, Schley P, Kruger D, Fischer G |
26 - 32 |
Low-temperature molecular beam epitaxy of Si1-x-yGexCy/Si quantum well structures : electrical and optical properties Grutzmacher D, Hartmann R, Schnappauf P, Gennser U, Muller E, Bachle D, Dommann A |
33 - 40 |
Molecular beam epitaxial growth and photoluminescence investigation of Si1-yCy layers Zerlauth S, Penn C, Seyringer H, Stangl J, Brunthaler G, Bauer G, Schaffler F |
41 - 46 |
Comparison of Si/Si1-x-yGexCy and Si/Si1-yCy heterojunctions grown by rapid thermal chemical vapor deposition Hoyt JL, Mitchell TO, Rim K, Singh DV, Gibbons JF |
47 - 50 |
Electrical and optical properties of phosphorus doped Ge1-yCy Dashiell MW, Troeger RT, Roe KJ, Khan AS, Orner B, Olowolafe JO, Berger PR, Wilson RG, Kolodzey J |
51 - 54 |
Effective mass measurement in two-dimensional hole gas in strained Si1-x-yGexCy/Si(100) modulation doped heterostructures Chang CL, Shukla SP, Pan W, Venkataraman V, Sturm JC, Shayegan M |
55 - 59 |
Alignment of Ge three-dimensional islands on faceted Si(001) surfaces Sakamoto K, Matsuhata H, Tanner MO, Wang DW, Wang KL |
60 - 64 |
Self-organized germanium quantum dots grown by molecular beam epitaxy on Si(100) Jiang ZM, Zhu HJ, Lu F, Qin J, Huang DM, Wang X, Hu CW, Chen YF, Zhu ZQ, Yao T |
65 - 69 |
Suppression of phonon replica in the radiative recombination of an MBE-grown type-II Ge/Si quantum dot Fukatsu S, Sunamura H, Shiraki Y, Komiyama S |
70 - 75 |
Influence of pre-grown carbon on the formation of germanium dots Schmidt OG, Lange C, Eberl K, Kienzle O, Ernst F |
76 - 80 |
Direct MBE growth of SiGe dots on ordered mesoporous glass-coated Si substrate Tang YS, Cai SJ, Jin GL, Wang KL, Soyez HM, Dunn BS |
81 - 85 |
Gas-source molecular beam epitaxial growth of SiGe alloy-based 'naked' quantum wells Kishimoto Y, Shiraki Y, Fukatsu S |
86 - 91 |
Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy Wohl G, Schollhorn C, Schmidt OG, Brunner K, Eberl K, Kienzle O, Ernst F |
92 - 97 |
Bimodal height distribution of self-assembled germanium islands grown on Si0.84Ge0.16 pseudo-substrates Pedersen EV, Jensen F, Shiryaev SY, Petersen JW, Hansen JL, Larsen AN |
98 - 105 |
Fabrication of SiGe quantum dots : a new approach based on selective growth on chemically prepared H-passivated Si(100) surfaces Le Thanh V |
106 - 110 |
Quantum wire transistor at locally grown edges Kaesen F, Hansch W, Eisele I, Kalus M |
111 - 115 |
Growth of SiGe/Si multiple quantum wells by ultra-high-vacuum electron cyclotron resonance chemical vapor deposition Joo SJ, Yoon E, Hwang SH, Whang KW, Chun SK, Kim YD |
116 - 119 |
Effect of Sb as a surfactant on the inner diffusion of epilayer Ge atoms into Si substrate Jiang ZM, Xu A, Hu DZ, Zhu HJ, Liu XH, Wang XJ, Mao MC, Zhang XJ, Hu JH, Huang DM, Wang X |
120 - 124 |
Atomic hydrogen for the formation of abrupt Sb doping profiles in MBE-grown Si Thompson PE, Silvestre C, Twigg M, Jernigan G, Simons DS |
125 - 130 |
Surfactant-grown low-doped germanium layers on silicon with high electron mobilities Hofmann KR, Reinking D, Kammler M, Horn-von Hoegen M |
131 - 135 |
Role of strain in dopant surface segregation during Si and SiGe growth by molecular beam epitaxy Ni WX, Hansson GV, Cardenas J, Svensson BG |
136 - 140 |
Artificial substrates for n- and p-type SiGe heterostructure field-effect transistors Hackbarth T, Kibbel H, Glueck M, Hoeck G, Herzog HJ |
141 - 147 |
X-ray scattering investigation of the interfaces in Si/Si1-xGex superlattices on Si(001) grown by MBE and UHV-CVD Baribeau JM, Lafontaine H |
148 - 152 |
Quantitative secondary ion mass spectrometry analysis of SiO2 desorption during in situ heat cleaning Kasper E, Bauer M, Oehme M |
153 - 157 |
Spontaneous oscillator strength modulation in MBE-grown Si/Ge superlattices Miyake Y, Shiraki Y, Fukatsu S |
158 - 162 |
Photoluminescence in UHV-CVD-grown Si1-xGex quantum wells on Si(100) : band alignment variation with excitation density and applied uniaxial stress Rowell NL, Aers GC, Lafontaine H, Williams RL |
163 - 166 |
Effect of layer thickness variation on light scattering by acoustic phonons in SiGe/Si superlattices Liu XH, Huang DM, Wang XJ, Zhu HJ, Wang X |
167 - 171 |
Structural characterization of a UHV/CVD-grown SiGe HBT with graded base Dion M, Houghton DC, Rowell NL, Perovic DD, Aers GC, Rolfe SJ, Sproule GI, Phillips JR |
172 - 180 |
Silicon germanium heterostructures in electronics : the present and the future Paul DJ |
181 - 185 |
Electrical properties of two-dimensional electron gases grown on cleaned SiGe virtual substrates Paul DJ, Ahmed A, Griffin N, Pepper M, Churchill AC, Robbins DJ, Wallis DJ |
186 - 195 |
Near and mid infrared silicon/germanium based photodetection Presting H |
196 - 200 |
Formation of thin gate oxides on SiGe with atomic oxygen Ogryzlo EA, Zheng L, Heinrich B, Myrtle K, Lafontaine H |
201 - 205 |
Bistable diodes grown by silicon molecular beam epitaxy Zhu XG, Zheng XY, Pak M, Tanner MO, Wang KL |
206 - 214 |
Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs Hansch W, Rao VR, Fink C, Kaesen F, Eisele I |
215 - 218 |
Quantum confined Stark shifts in type-I SiGe quantum structures Kim JY |
219 - 222 |
Luminescence from erbium- and oxygen-doped SiGe grown by molecular beam epitaxy Neufeld E, Sticht A, Brunner K, Abstreiter G, Bay H, Buchal C, Holzbrecher H |
223 - 227 |
Incorporation and luminescence properties of Er2O3 and ErF3 doped Si layers grown by molecular beam epitaxy Ni WX, Joelsson KB, Du CX, Pozina G, Buyanova IA, Chena WM, Hansson GV, Monemar B |
228 - 233 |
Application of selective epitaxial growth in MBE for short-duration gating systems Cers VA, Ballik EA |
234 - 240 |
Epitaxial Si/SiO2 low dimensional structures Ishikawa Y, Shibata N, Fukatsu S |
241 - 244 |
Characterization of SiGe strained heterostructures grown by molecular beam epitaxy using a Si effusion cell Yaguchi H, Yamamoto T, Shiraki Y |
245 - 250 |
Molecular beam epitaxy growth and thermal stability of Si1-xGex layers on extremely thin silicon-on-insulator substrates Brunner K, Dobler H, Abstreiter G, Schafer H, Lustig B |
251 - 255 |
Self-ordering of CoSi2 precipitates and epitaxial layer growth of CoSi2 on Si(100) Mantl S, Hacke M, Bay HL, Kappius L, Mesters S |
256 - 260 |
Si selective epitaxial growth using Cl-2 pulsed molecular flow method Aoyama T, Saito S, Tatsumi T |
261 - 264 |
Low temperature electrical surface passivation of MBE-grown pin diodes by hydrogen and oxygen plasma processes Strass A, Hansch W, Kaesen F, Fehlauer G, Bieringer P, Fischer A, Eisele I |
VIII - VIII |
Proceedings of the 7th International Symposium on Silicon Molecular Beam Epitaxy - Banff, Canada, July 13-17, 1997 - Preface Baribeau JM |