Thin Solid Films

Thin Solid Films, Vol.414, No.1 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (22 articles)

1 - 6	Characterization of porous silicate for ultra-low k dielectric application Liu PT, Chang TC, Hsu KC, Tseng TY, Chen LM, Wang CJ, Sze SM
7 - 12	Ion plating discharges: evidence of cluster formation during metal evaporation Davison A, Wilson AD, Avelar-Batista JC, Leyland A, Matthews A, Fancey KS
13 - 17	Properties of nitrogen doped silicon films deposited by low pressure chemical vapour deposition from disilane and ammonia Temple-Boyer P, Jalabert L, Couderc E, Scheid E, Fadel P, Rousset B
18 - 24	Raman and photoluminescence study of magnetron sputtered amorphous carbon films Papadimitriou D, Roupakas G, Xue C, Topalidou A, Panayiotatos Y, Dimitriadis CA, Logothetidis S
25 - 30	Photochemical deposition of ZnSe polycrystalline thin films and their characterization Kumaresan R, Ichimura M, Arai E
31 - 38	The characteristics of interface misfit dislocations for epitaxial alpha-Fe2O3 on alpha-Al2O3(0001) Wang CM, Thevuthasan S, Gao F, McCready DE, Chambers SA
39 - 42	Epitaxial yttrium growth mode on BaF2 (111) and CaF2 (111) Jacob A, Borgschulte A, Schoenes J
43 - 55	ZnO/Al2O3 nanolaminates fabricated by atomic layer deposition: growth and surface roughness measurements Elam JW, Sechrist ZA, George SM
56 - 62	Leakage current distribution in ultrathin oxide on silicon surface with step/terrace structures Murata M, Tokuda N, Hojo D, Yamabe K
63 - 71	Frictional contact analysis of scratch test for elastic and elastic-plastic thin-coating/substrate materials Jiang XY, Lauke B, Schueller T
72 - 77	Supramolecular interaction of diamino calix[4]arene derivative with nucleotides at the air-water interface Liu F, Lu GY, He WJ, Liu MH, Zhu LG
78 - 90	Three-dimensional wafer-scale copper chemical-mechanical planarization model Thakurta DG, Schwendeman DW, Gutmann RJ, Shankar S, Jiang L, Gill WN
91 - 98	A new systematic method of characterization for the strength of thin films on substrates - evaluation of mechanical properties by means of'film projection' Kamiya S, Kimura H, Yamanobe K, Saka M, Abe H
99 - 104	Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics Carlotti G, Colpani P, Piccolo D, Santucci S, Senez V, Socino G, Verdini L
105 - 112	Microstructure and electroluminescence of ZnS : Mn doped with KCl Zhai Q, Li J, Lewis JS, Waldrip KA, Jones K, Holloway PH, Davidson M, Evans N
113 - 118	The structural phase transition and mechanism of abnormal temperature dependence of conductivity in ZnTe : Cu polycrystalline thin films Zhang JQ, Feng LH, Cai W, Zheng JG, Cai YP, Li B, Wu LL, Shao Y
119 - 122	The correlation between mechanical stress and magnetic properties of cobalt ultra thin films Belhi R, Mliki N, Jomni S, Ayadi M, Abdelmoula K, Gergaud P, Clugnet G, Charai A
123 - 128	Raman study on Bi-Pb-Sr-Ca-Cu-O superconductor thin films grown by spray pyrolysis on several types of substrate Mejia-Garcia C, Diaz-Valdes E, Contreras-Puente G, Lopez-Lopez JL, Jergel M
129 - 135	Synthesis and characterization of single and multilayer boron nitride and boron carbide thin films grown by magnetron sputtering of boron carbide Guruz MU, Dravid VP, Chung YW
136 - 142	Exactly solvable model for metal-insulator-metal stepped boundary tunnel junctions Shu QQ, Jiang Y, Meng S, Lin G, Ma WG
143 - 149	An in-plane anisotropic organic semiconductor based upon poly(3-hexyl thiophene) Amundson KR, Sapjeta BJ, Lovinger AJ, Bao ZN
150 - 153	Effect of deposition rate on structural and electrical properties of Al films deposited on glass by electron beam evaporation Qui H, Wang FP, Wu P, Pan LQ, Li LY, Xiong LY, Tian Y